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SCAN18540T

Features: IEEE 1149.1 (JTAG) compliant Dual output enable signals per byte TRI-STATE outputs for bus-oriented applications 9-bit data busses for parity applications Reduced-swing outputs source 24 mA/sink 48 mA (Mil) Guaranteed to drive 50 transmission line to TTL input levels of 0.8V and 2.0V TT...

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SeekIC No. : 004485830 Detail

SCAN18540T: Features: IEEE 1149.1 (JTAG) compliant Dual output enable signals per byte TRI-STATE outputs for bus-oriented applications 9-bit data busses for parity applications Reduced-swing outputs source 24 ...

SCAN18540T Data Sheet

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Part Number:
SCAN18540T
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

IEEE 1149.1 (JTAG) compliant
Dual output enable signals per byte
TRI-STATE outputs for bus-oriented applications
9-bit data busses for parity applications
Reduced-swing outputs source 24 mA/sink 48 mA (Mil)
Guaranteed to drive 50 transmission line to TTL input levels of 0.8V and 2.0V
TTL compatible inputs
25 mil pitch Cerpack packaging
Includes CLAMP and HIGHZ instructions
Standard Microcircuit Drawing (SMD) 5962-9312701


Pinout

Connection Diagram


Specifications

If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications.
Supply Voltage (VCC)                                                             −0.5V to +7.0V
DC Input Diode Current (IIK)
VI = −0.5V                                                                             −20 mA
VI = VCC +0.5V                                                                      +20 mA
DC Output Diode Current (IOK)
VO = −0.5V                                                                            −20 mA
VO = VCC +0.5V                                                                     +20 mA
DC Output Voltage (VO)                                                         −0.5V to VCC +0.5V
DC Output Source/Sink Current (IO)                                     ±70 mA
DC VCC or Ground Current
Per Output Pin                                                                      ±70 mA
Junction Temperature
Cerpack                                                                                +175°C
Storage Temperature                                                           −65°C to +150°C
ESD (Min)                                                                              2000V


Description

The SCAN18540T is a high speed, low-power line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented paired output enable control signals. This SCAN18540T is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).




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