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SCAN921260

Features: IEEE 1149.1 (JTAG) Compliant and at-speed BIST test modes Deserializes one to six BusLVDS input serial data streams with embedded clocks Seven selectable serial inputs to support n+1 redundancy of deserialized streams Seventh channel has single pin monitor output that reflects input fro...

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SCAN921260: Features: IEEE 1149.1 (JTAG) Compliant and at-speed BIST test modes Deserializes one to six BusLVDS input serial data streams with embedded clocks Seven selectable serial inputs to support n+1 redu...

SCAN921260 Data Sheet

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Part Number:
SCAN921260
Supply Ability:
5000

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  • 1~5000
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  • Processing time
  • 15 Days
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Upload time: 2025/12/26

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Product Details

Description



Features:

IEEE 1149.1 (JTAG) Compliant and at-speed BIST test modes
Deserializes one to six BusLVDS input serial data streams with embedded clocks
Seven selectable serial inputs to support n+1 redundancy of deserialized streams
Seventh channel has single pin monitor output that reflects input from seventh channel input
Parallel clock rate up to 66MHz
On chip filtering for PLL
High impedance inputs upon power off (Vcc = 0V)
Single power supply at +3.3V
196-pin LBGA package (Low-profile Ball Grid Array) package
Industrial temperature range operation: −40 to +85




Specifications

If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications.
Supply Voltage (VCC) −0.3V to +4V
LVCMOS/LVTTL Input Voltage−0.3V to 3.9V
LVCMOS/LVTTL Output Voltage −0.3V to 3.9V
Bus LVDS Receiver Input Voltage −0.3V to 3.9V
Bus LVDS Driver Output Voltage−0.3V to 3.9V
Bus LVDS Output Short Circuit
Duration 10ms
Junction Temperature+150°C
Storage Temperature −65°C to +150°C
Lead Temperature
(Soldering, 10 seconds)+225°C
Max Pkg Power Dissipation Capacity @ 25°C
196L BGA 3.7 W
Package Derating:
196L BGA 29.4 mW/°C above
+25°C
Thermal Resistance:
JA 34°C/W
JC 8°C/W
ESD Rating:
Human Body Model >2KV
Machine Model >750V

Function Deserializer
Total Throughput 3960 Mbps
Payload/Channel 660 Mbps
Clock Min 20 MHz
Clock Max 66 MHz
Input Compatibility LVDS/BLVDS
Output Compatibility LVTTL
Start/Stop Bit Yes
Power Consumption_ 1980 mW
SupplyVoltage 3.3 Volt
ESD 2 kV
Temperature Min -40 deg C
Temperature Max 85 deg C
Compression Ratio 10:1
Number Receivers 6
JTAG1149.1 Yes
Communications Yes
Sensing & Imaging Yes
Parallel Bus Width 10 bits
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Description

The SCAN921260 integrates six deserializer devices into a single chip. The SCAN921260 can simultaneously deserialize up to six data streams that have been serialized by the National Semiconductor SCAN921023 Bus LVDS serializer. The device also includes a seventh serial input channel that serves as a redundant input.

Each deserializer block in the SCAN921260 operates independently with its own clock recovery circuitry and lockdetect signaling.

The SCAN921260 uses a single +3.3V power supply with an estimated power dissipation of 1.2W at 3.3V with a PRBS-15 pattern. Refer to the Connection Diagrams for packaging information.



The SCAN921260 integrates six deserializer devices into a single chip. The SCAN921260 can simultaneously deserialize up to six data streams that have been serialized by the National Semiconductor SCAN921023 Bus LVDS serializer. The device also includes a seventh serial input channel that serves as a redundant input.

Each deserializer block in the SCAN921260 operates independently with its own clock recovery circuitry and lock-detect signaling.

The SCAN921260 uses a single +3.3V power supply with an estimated power dissipation of 1.2W at 3.3V with a PRBS-15 pattern. Refer to the Connection Diagrams for packaging information.

Reliability Metrics

Part Number Process EFR Reject EFR Sample Size PPM LTA Rejects LTA Device Hours FITS MTTF (Hours)
SCAN921260UJB CMOS8 1 12195 83 0 1410500 3 400233226

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

For more information on Reliability Metrics, please click here.


Application Notes

Title Size in Kbytes Date
AN-1217: Application Note 1217 How to Validate BLVDS SER/DES Signal Integrity Using an Eye Mask 339 Kbytes 2-May-04 Download

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