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SN54BCT8244A

Features: Members of the Texas Instruments SCOPEETM Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to 'F244 and 'BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Oper...

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SeekIC No. : 004496764 Detail

SN54BCT8244A: Features: Members of the Texas Instruments SCOPEETM Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to 'F244 and 'BCT244 in the Normal-Function Mode Compatible...

SN54BCT8244A Data Sheet

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Part Number:
SN54BCT8244A
Supply Ability:
5000

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  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

Members of the Texas Instruments SCOPEETM Family of Testability Products
Octal Test-Integrated Circuits
Functionally Equivalent to 'F244 and 'BCT244 in the Normal-Function Mode
Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
Test Operation Synchronous to Test Access Port (TAP)
Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
SCOPEE Instruction Set
     IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP and HIGHZ
     Parallel-Signature Analysis at Inputs
     Pseudo-Random Pattern Generation From Outputs
     Sample Inputs/Toggle Outputs
Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and  Ceramic 300-mil DIPs (JT, NT)


Specifications

Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0.5 V to 7 V
Input voltage range, VI: except TMS (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  0.5 V to 7 V
                                  TMS (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  . .0.5 V to 12 V
Voltage range applied to any output in the disabled or power-off state . . . . . . . . . . . . . . . .  0.5 V to 5.5 V
Voltage range applied to any output in the high state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0.5 V to VCC
Input clamp current, IIK . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 mA
Current into any output in the low state: SN54BCT8244A (TDO) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .40 mA
                                                                 SN54BCT8244A (any Y) . . . . . . . . . . . . . . . . . . .  . . . . . . . . . 96 mA
                                                                 SN74BCT8244A (TDO) . . . . . . . . . . . . . . . . . . . . . . . . .  . . . . 48 mA
                                                                 SN74BCT8244A (any Y) . . . . . . . . . . . . . . . . . . . . . ...  . . . . 128 mA
Maximum power dissipation at TA = 55°C (in still air) (see Note 2): DW package . . . . . . . . . . . . . . . .   1.7 W
                                                                                                           NT package . . . . . . . . . . . . . .  . . . 1.3 W
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .    65°C to 150°C


Description

The SN54BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPEETM testability integrated-circuit family. Thisfamily of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, SN54BCT8244A is functionally equivalent to the 'F244 and 'BCT244 octal buffers. The test circuitry of SN54BCT8244A can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPEE TMoctal buffers.

In the test mode, the normal operation of the SCOPEETM octal buffers is inhibited and the test circuitry of SN54BCT8244A is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry of SN54BCT8244A can perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990.




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