ApplicationAudiowww.ti.com/audioAutomotive www.ti.com/automotiveBroadband www.ti.com/broadbandDigital Control www.ti.com/digitalcontrolMilitary www.ti.com/militaryOptical Networking www.ti.com/opticalnetworkSecurity www.ti.com/securityTelephony www.ti.com/telephonyVideo & Imaging www.ti.com/vi...
SN54LVT182512: ApplicationAudiowww.ti.com/audioAutomotive www.ti.com/automotiveBroadband www.ti.com/broadbandDigital Control www.ti.com/digitalcontrolMilitary www.ti.com/militaryOptical Networking www.ti.com/optic...
SeekIC Buyer Protection PLUS - newly updated for 2013!
268 Transactions
All payment methods are secure and covered by SeekIC Buyer Protection PLUS.
Features: PinoutSpecificationsDescriptionThe SN54/74LS147 and SN54/74LS148 are Priority Encoders. ...
PinoutDescriptionThe LS155 and LS156 are Dual 1-of-4 Decoder/Demultiplexers with common Address in...

The 'LVT18512 and 'LVT182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPEETM testability integrated-circuit family. 'LVT18512 and 'LVT182512 supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
Additionally, 'LVT18512 and 'LVT182512 are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.