SN54LVT8996

Features: ` Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture` Extend Scan Access From Board Level to Higher Levels of System Integration` Promote Reuse of Lower-Level (Chip/Bo...

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SeekIC No. : 004497173 Detail

SN54LVT8996: Features: ` Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture` Extend Scan Ac...

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Part Number:
SN54LVT8996
Supply Ability:
5000

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  • 1~5000
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Upload time: 2025/12/24

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Product Details

Description



Features:

` Members of the Texas Instruments (TIE)
  Broad Family of Testability Products
  Supporting IEEE Std 1149.1-1990 (JTAG)
  Test Access Port (TAP) and Boundary-Scan
  Architecture
` Extend Scan Access From Board Level to
  Higher Levels of System Integration
` Promote Reuse of Lower-Level
  (Chip/Board) Tests in System Environment
` While Powered at 3.3 V, Both the Primary
  and Secondary TAPs Are Fully 5-V Tolerant
  for Interfacing to 5-V and/or 3.3-V Masters
  and Targets
` Switch-Based Architecture Allows Direct
  Connect of Primary TAP to Secondary TAP
` Primary TAP Is Multidrop for Minimal Use of
  Backplane Wiring Channels
` Shadow Protocols Can Occur in Any of
  Test-Logic-Reset, Run-Test/Idle, Pause-DR,
  and Pause-IR TAP States to Provide for
  Board-to-Board Test and Built-In Self-Test
` Simple Addressing (Shadow) Protocol Is
  Received/Acknowledged on Primary TAP
` 10-Bit Address Space Provides for up to
  1021 User-Specified Board Addresses
` Bypass (BYP) Pin Forces
  Primary-to-Secondary Connection Without
  Use of Shadow Protocols
` Connect (CON) Pin Provides Indication of
  Primary-to-Secondary Connection
` High-Drive Outputs (32-mA IOH, 64-mA IOL)
  Support Backplane Interface at Primary and
  High Fanout at Secondary
` Latch-Up Performance Exceeds 100 mA Per
  JESD 78, Class II
` ESD Protection Exceeds JESD 22
2000-V Human-Body Model (A114-A)
200-V Machine Model (A115-A)
1000-V Charged-Device Model (C101)
` Package Options Include Plastic
  Small-Outline (DW) and Thin Shrink
  Small-Outline (PW) Packages, Ceramic
  Chip Carriers (FK), and Ceramic DIPs (JT)



Pinout

  Connection Diagram


Specifications

Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0.5 V to 4.6 V
Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  0.5 V to 7 V
Voltage range applied to any output in the high-impedance or power-off state, VO
(see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0.5 V to 7 V
Current into any output in the low state, IO: SN54LVT8996 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  96 mA
SN74LVT8996 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  . . . . . . . . . . .  . . . . . . . . . . .  . . . . . . . . . . .  . 128 mA
Current into any output in the high state, IO (see Note 2): SN54LVT8996 . . . . . . . . . . . . . . . . . . . . . . . . . . 48 mA
SN74LVT8996 . . . . . . . . . . . . . . . . . . . . . . . .  . . . . . . . . . . .  . . . . . . . . . . .  . . . . . . . . . . .  . . . . . . . . . . .  . . 64 mA
Input clamp current, IIK (VI < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA
Output clamp current, IOK (VO < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA
Package thermal impedance, qJA (see Note 3): DW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46°C/W
PW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  . . . . . . . . . . .  . . . . . . . . . . .  . . . . .  88°C/W
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .65°C to 150°C
† Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings can be exceeded if the input and output clamp-current ratings are observed.
2. This current flows only when the output is in the high state and VO > VCC.
3. The package thermal impedance is calculated in accordance with JESD 51.



Description

The 'LVT8996 10-bit addressable scan ports (ASP) are members of the Texas Instruments SCOPEE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most SCOPEE devices, the ASP LVT8996 is not a boundary-scannable device, rather, it applies TI's addressable-shadow-port technology to the IEEE Std 1149.1-1990 (JTAG) test access port (TAP) to extend scan access beyond the board level.

LVT8996 is functionally equivalent to the 'ABT8996 ASPs. Additionally, they are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to interface to 5-V masters and/or targets. Conceptually, the ASP is a simple switch, LVT8996 can be used to directly connect a set of multidrop primary TAP signals to a set of secondary TAP signals for example, to interface backplane TAP signals to a board-level TAP. The ASP provides all signal buffering that might be required at these two interfaces. When primary and secondary TAPs are connected, only a moderate propagation delay is introduced no storage/retiming elements are inserted. LVT8996 minimizes the need for reformatting board-level test vectors for in-system use. Most operations of the ASP are synchronous to the primary test clock (PTCK) input. PTCK is always buffered directly onto the secondary test clock (STCK) output.

Upon power up of the LVT8996, the ASP assumes a condition in which the primary TAP is disconnected from the secondary TAP (unless the bypass signal is used, as below). This reset condition also can be entered by the assertion of the primary test reset (PTRST) input or by use of shadow protocol. PTRST LVT8996 is always buffered directly onto the secondary test reset (STRST) output, ensuring that the ASP and its associated secondary TAP can be reset simultaneously.

When connected, the primary test data input (PTDI) and primary test mode select (PTMS) input of LVT8996 are buffered onto the secondary test data output (STDO) and secondary test mode select (STMS) output, respectively, while the secondary test data input (STDI) is buffered onto the primary test data output (PTDO). When disconnected, STDO is at high impedance, while PTDO LVT8996 is at high impedance, except during acknowledgment of a shadow protocol. Upon disconnect of the secondary TAP, STMS holds its last low or high level, allowing the secondary TAP to be held in its last stable state. Upon reset of the ASP, STMS is high, allowing the secondary TAP to be synchronously reset to the Test-Logic-Reset state.

In system, primary-to-secondary connection is based on shadow protocols that are received and acknowledged on PTDI and PTDO, respectively. These protocols can occur in any of the stable TAP states other than Shift-DR or Shift-IR (i.e., Test-Logic-Reset, Run-Test/Idle, Pause-DR or Pause-IR). The essential nature of the protocols is to receive/transmit an address via a serial bit-pair signaling scheme. When an address is received serially at PTDI that matches that at the parallel address inputs (A9A0), the ASP LVT8996 serially retransmits its address at PTDO as an acknowledgment and then assumes the connected (ON) status, as above. If the received address does not match that at the address inputs, the ASP LVT8996 immediately assumes the disconnected (OFF) status without acknowledgment.

The ASP LVT8996 also supports three dedicated addresses that can be received globally (that is, to which all ASPs respond) during shadow protocols. Receipt of the dedicated disconnect address (DSA) causes the ASP to disconnect in the same fashion as a nonmatching address. Reservation of this address for global use ensures that at least one address is available to disconnect all receiving ASPs. The DSA LVT8996 is especially useful when the secondary TAPs of multiple ASPs LVT8996 are to be left in different stable states. Receipt of the reset address (RSA) causes the ASP to assume the reset condition, as above. Receipt of the test-synchronization address (TSA) causes the ASP to assume a connect status (MULTICAST) in which PTDO is at high impedance but the connections from PTMS to STMS and PTDI to STDO are maintained to allow simultaneous operation of the secondary TAPs of multiple ASPs. This is useful for multicast TAP-state movement, simultaneous test operation (such as in Run-Test/Idle state), and scanning of common test data into multiple like scan chains. The TSA LVT8996 is valid only when received in the Pause-DR or Pause-IR TAP states.




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