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Part Number: SN74ACT244-EP

 

 

 

 

Description: The SN74ACT244-EP octal buffer/driver is designed specifically to improve the performance and density ...


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SN74ACT244-EP General Description


The SN74ACT244-EP octal buffer/driver is designed specifically to improve the performance and density of
3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters.

The device is organized as two 4-bit buffers/drivers with separate output-enable (OE) inputs. When OE is low, the device passes noninverted data from the A inputs to the Y outputs. When OE is high, the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

SN74ACT244-EP Maximum Ratings

    MIN MAX UNIT
VCC Supply voltage range   0.5 7 V
VI Input voltage range(2)   0.5 VCC + 0.5 V
VO Output voltage range(2)   0.5 VCC + 0.5 V
IIK Input clamp current VI < 0 or VI > VCC   ±20 mA
IOK Output clamp current VO < 0 or VO > VCC   ±20 mA
IO Continuous output current VO = 0 to VCC   ±50 mA
Continuous current through VCC or GND   ±200 mA
JA Package thermal impedance(3) DW package   58 /W
NS package   60
Tstg Storage temperature range(4) 65 150

(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input and output voltage ratings may be exceeded if the input and output current ratings are  bserved.
(3) The package thermal impedance is calculated in accordance with JESD 51-7.
(4) Long-term high-temperature storage and/or extended use at maximum recommended operating conditions may result in a reduction of overall device life. See http://www.ti.com/ep_quality for additional information on enhanced plastic  ackaging.

SN74ACT244-EP Features

` Controlled Baseline
One Assembly/Test Site, One Fabrication Site
` Extended Temperature Performance of up to 55 to 125
` Enhanced Diminishing Manufacturing Sources (DMS) Support
` Enhanced Product-Change Notification
` Qualification Pedigree (1)
` 4.5-V to 5.5-V VCC Operation
` Inputs Accept Voltages to 5.5 V
` Max tpd of 9.5 ns at 5 V
` Inputs Are TTL Compatible
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits

SN74ACT244-EP Connection Diagram

SN74ACT244-EP  Connection Diagram

SN74ACT244-EP datasheet

SN7000
PDF/DataSheet Download

  • Datasheet: SN7000
  • File Size: 81454 KB
  • Manufacturer: SIEMENS [Siemens Semiconductor Group]
  • Click here to Download

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