Position: Home  > All Categories> Integrated Circuits (ICs) > SN74BCT8244A

SN74BCT8244A

Features: Members of the Texas Instruments SCOPEETM Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to 'F244 and 'BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Oper...

product image

SN74BCT8244A Picture
See larger image
SeekIC No. : 004498638 Detail

SN74BCT8244A: Features: Members of the Texas Instruments SCOPEETM Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to 'F244 and 'BCT244 in the Normal-Function Mode Compatible...

SN74BCT8244A Data Sheet

floor Price/Ceiling Price

Get Latest Price
Part Number:
SN74BCT8244A
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

SeekIC Buyer Protection PLUS - newly updated for 2013!

  • Escrow Protection.
  • Guaranteed refunds.
  • Secure payments.
  • Learn more >>

Month Sales

268 Transactions

Rating

evaluate  (4.8 stars)

Upload time: 2025/12/24

add to my favourite

Payment Methods

All payment methods are secure and covered by SeekIC Buyer Protection PLUS.

Notice: When you place an order, your payment is made to SeekIC and not to your seller. SeekIC only pays the seller after confirming you have received your order. We will also never share your payment details with your seller.
Product Details

Description



Features:

Members of the Texas Instruments SCOPEETM Family of Testability Products
Octal Test-Integrated Circuits
Functionally Equivalent to 'F244 and 'BCT244 in the Normal-Function Mode
Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
Test Operation Synchronous to Test Access Port (TAP)
Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
SCOPEE Instruction Set
     IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP and HIGHZ
     Parallel-Signature Analysis at Inputs
     Pseudo-Random Pattern Generation From Outputs
     Sample Inputs/Toggle Outputs
Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and  Ceramic 300-mil DIPs (JT, NT)


Specifications

Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0.5 V to 7 V
Input voltage range, VI: except TMS (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  0.5 V to 7 V
                                  TMS (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  . .0.5 V to 12 V
Voltage range applied to any output in the disabled or power-off state . . . . . . . . . . . . . . . .  0.5 V to 5.5 V
Voltage range applied to any output in the high state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0.5 V to VCC
Input clamp current, IIK . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 mA
Current into any output in the low state: SN54BCT8244A (TDO) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .40 mA
                                                                 SN54BCT8244A (any Y) . . . . . . . . . . . . . . . . . . .  . . . . . . . . . 96 mA
                                                                 SN74BCT8244A (TDO) . . . . . . . . . . . . . . . . . . . . . . . . .  . . . . 48 mA
                                                                 SN74BCT8244A (any Y) . . . . . . . . . . . . . . . . . . . . . ...  . . . . 128 mA
Maximum power dissipation at TA = 55°C (in still air) (see Note 2): DW package . . . . . . . . . . . . . . . .   1.7 W
                                                                                                           NT package . . . . . . . . . . . . . .  . . . 1.3 W
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .    65°C to 150°C


Description

The 'BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPEETM testability integrated-circuit family. Thisfamily of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices SN74BCT8244A are functionally equivalent to the 'F244 and 'BCT244 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPEE TMoctal buffers.

In the test mode, the normal operation of the SCOPEETM octal buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of SN74BCT8244A. When enabled, the test circuitry can perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990.




Customers Who Bought This Item Also Bought

Margin,quality,low-cost products with low minimum orders. Secure your online payments with SeekIC Buyer Protection.
You may also be interested in :
Prototyping Products
AVT4168
DE1
Transformers
TM-09210
BV222-1-00992
Cables, Wires
821-0814-a
415-0100-150
Integrated Circuits (ICs)
TA8435H
1MB12-140
RF and RFID
X3C26P1-30S
1P620S
Industrial Controls, Meters
SGDM-15ADA
41AA1600E
View more