SN74BCT8373ADWE4

Specialty Function Logic Device w/Octal D-Type Latches

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SeekIC No. : 00449047 Detail

SN74BCT8373ADWE4: Specialty Function Logic Device w/Octal D-Type Latches

floor Price/Ceiling Price

US $ 4.04~5.74 / Piece | Get Latest Price
Part Number:
SN74BCT8373ADWE4
Mfg:
Texas Instruments
Supply Ability:
5000

Price Break

  • Qty
  • 0~1
  • 1~25
  • 25~100
  • 100~250
  • Unit Price
  • $5.74
  • $4.84
  • $4.44
  • $4.04
  • Processing time
  • 15 Days
  • 15 Days
  • 15 Days
  • 15 Days
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Upload time: 2025/12/24

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Product Details

Quick Details

Product : Boundry Scan JTAG Logic Series : 74BCT
Operating Supply Voltage : 4.5 V to 5.5 V Package / Case : SOIC-24 Wide
Packaging : Tube    

Description

Packaging : Tube
Operating Supply Voltage : 4.5 V to 5.5 V
Package / Case : SOIC-24 Wide
Product : Boundry Scan JTAG Logic
Series : 74BCT


Description

The SN74BCT8373ADWE4 is one member of the SN74BCT8373A series.The 'BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPEE testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

Features of the SN74BCT8373ADWE4 are:(1)octal test-integrated circuits; (2)functionally equivalent to 'F373 and 'BCT373 in the normal-function mode; (3)compatible with the IEEE standard 1149.1-1990 (JTAG) test access port and boundary-scan architecture; (4)test operation synchronous to test access port (TAP); (5)implement optional test reset signal by recognizing a double-high-level voltage (10 V) on TMS Pin.The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPEE octal latches.

The absolute maximum ratings of the SN74BCT8373ADWE4 can be summarized as:(1)supply voltage range:-0.5 to 7.0V;(2)input voltage range:-0.5 to 7.0V;(3)voltage range applied to any output in the high state:-0.5 to Vcc;(4)input clamp current:-30mA;(5)voltage range applied to any output in the disabled or power-off state:0.5 V to 5.5 V; (6)storage temperature range:-65 to 150.The device powers up in the Test-Logic-Reset state. In the stable Test-Logic-Reset state, the test logic is reset and is disabled so that the normal logic function of the device is performed. The instruction register is reset to an opcode that selects the optional IDCODE instruction, if supported, or the BYPASS instruction. Certain data registers also can be reset to their power-up values.The state machine is constructed such that the TAP controller returns to the Test-Logic-Reset state in no more than five TCK cycles if TMS is left high. The TMS pin of the SN74BCT8373ADWE4 has an internal pullup resistor that forces it high if left unconnected or if a board defect causes is to be open circuited.




Parameters:

Technical/Catalog InformationSN74BCT8373ADWE4
VendorTexas Instruments
CategoryIntegrated Circuits (ICs)
Logic TypeScan Test Device with D-Type Latches
Mounting TypeSurface Mount
Package / Case24-SOIC (7.5mm Width)
Supply Voltage4.5 V ~ 5.5 V
PackagingTube
Operating Temperature0°C ~ 70°C
Drawing Number296; 4040000-5; DW; 24
Lead Free StatusLead Free
RoHS StatusRoHS Compliant
Other Names SN74BCT8373ADWE4
SN74BCT8373ADWE4



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