SN74BCT8374A

Pinout




Specifications

Supply voltage range, V_CC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-0.5 V to 7 V
Input voltage range, V_I (see Note 1)  . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5 V to 7 V
                                 TMS (see Note 1)  . . . . . . . . . . . . . . . . . .  . . . .  0.5 V to 12 V
Voltage range applied to any output in the high or 
                             power-off state,  . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5 V to 5.5 V
Voltage range applied to any output in the high state  . . . . . . . . . . .  0.5 V to V_CC
Input clamp current, I_IK   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .30 mA
Current into any output in the low state:SN54BCT8374A (TDO)     . . . . . . . . .  40 mA
                                                                SN54BCT8374A (any Q)     . . . . . . . .  96 mA
                                                                SN74BCT8374A (TDO)      . . . . . . .. . . 48 mA
                                                                SN74BCT8374A (any Q)      . .. . . . . . 128 mA
Maximum power dissipation at T_A = 55 (in still air) (see Note 2):DW package  .1.7 W
                                                                                                       NT package  . 1.3 W
Storage temperature range, T_stg  . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65 to 150


Description

The 'BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE(TM) testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these SN74BCT8374A devices are functionally equivalent to the 'F374 and 'BCT374 octal D-type flip-flops.The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE(TM) octal flip-flops.