Features: ` Controlled Baseline One Assembly Site One Test Site One Fabrication Site` Extended Temperature Performance of 55 to 125 ` Enhanced Diminishing Manufacturing Sources (DMS) Support` Enhanced Product-Change Notification` Qualification Pedigree (1)` Available in the Texas Instruments N...
SN74LVC1G06-EP: Features: ` Controlled Baseline One Assembly Site One Test Site One Fabrication Site` Extended Temperature Performance of 55 to 125 ` Enhanced Diminishing Manufacturing Sources (DMS) Support` En...
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` Controlled Baseline
One Assembly Site
One Test Site
One Fabrication Site
` Extended Temperature Performance of 55 to 125
` Enhanced Diminishing Manufacturing Sources (DMS) Support
` Enhanced Product-Change Notification
` Qualification Pedigree (1)
` Available in the Texas Instruments NanoStar™ and NanoFree™ Packages
` Supports 5-V VCC Operation
` Input and Open-Drain Output Accept Voltages up to 5.5 V
` Max tpd of 4 ns at 3.3 V
` Low Power Consumption, 10-mA Max ICC
` ±24-mA Output Drive at 3.3 V
` Ioff Supports Partial-Power-Down Mode Operation
` Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
` ESD Protection Exceeds JESD 22
2000-V Human-Body Model (A114-A)
200-V Machine Model (A115-A)
1000-V Charged-Device Model (C101)
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
| MIN MAX | UNIT | ||
| VCC Supply voltage range | -0.5 6.5 |
V | |
| VI Input voltage range(2) | -0.5 6.5 |
V | |
| VO Voltage range applied to any output in the high-impedance or power-off state(2) | -0.5 6.5 |
V | |
| VO Voltage range applied to any output in the high or low state(2) (3) | -0.5 6.5 |
V | |
| IIK Input clamp current | VI < 0 V | -50 |
mA |
| IOK Output clamp current | VO < 0 V | -50 |
mA |
| IO Continuous output current | ±50 |
mA | |
| Continuous current through VCC or GND | ±100 |
mA | |
| JA Package thermal impedance(4) | 252 |
/W | |
| Tstg Storage temperature range | -65 150 | ||
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the devic at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input and output negative-voltage ratings may be exceeded if the input and output current ratings are observed.
(3) The value of VCC is provided in the recommended operating conditions table.
(4) The package thermal impedance is calculated in accordance with JESD 51-7.