SN74LVC1G06-EP

Features: ` Controlled Baseline One Assembly Site One Test Site One Fabrication Site` Extended Temperature Performance of 55 to 125 ` Enhanced Diminishing Manufacturing Sources (DMS) Support` Enhanced Product-Change Notification` Qualification Pedigree (1)` Available in the Texas Instruments N...

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SeekIC No. : 004499245 Detail

SN74LVC1G06-EP: Features: ` Controlled Baseline One Assembly Site One Test Site One Fabrication Site` Extended Temperature Performance of 55 to 125 ` Enhanced Diminishing Manufacturing Sources (DMS) Support` En...

floor Price/Ceiling Price

Part Number:
SN74LVC1G06-EP
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/12/24

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Product Details

Description



Features:

` Controlled Baseline
    One Assembly Site
    One Test Site
    One Fabrication Site
` Extended Temperature Performance of 55 to 125
` Enhanced Diminishing Manufacturing Sources (DMS) Support
` Enhanced Product-Change Notification
` Qualification Pedigree (1)
` Available in the Texas Instruments NanoStar™ and NanoFree™ Packages
` Supports 5-V VCC Operation
` Input and Open-Drain Output Accept Voltages up to 5.5 V
` Max tpd of 4 ns at 3.3 V
` Low Power Consumption, 10-mA Max ICC
` ±24-mA Output Drive at 3.3 V
` Ioff Supports Partial-Power-Down Mode Operation
` Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
` ESD Protection Exceeds JESD 22
  2000-V Human-Body Model (A114-A)
  200-V Machine Model (A115-A)
  1000-V Charged-Device Model (C101)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.




Specifications

  MIN   MAX UNIT
VCC    Supply voltage range -0.5     6.5

V

VI       Input voltage range(2) -0.5    6.5

V

VO     Voltage range applied to any output in the high-impedance or power-off state(2) -0.5    6.5

V

VO     Voltage range applied to any output in the high or low state(2) (3) -0.5    6.5

V

IIK     Input clamp current VI < 0 V            -50

mA

IOK    Output clamp current VO < 0 V            -50

mA

IO     Continuous output current          ±50

mA

        Continuous current through VCC or GND        ±100

mA

JA Package thermal impedance(4)           252

/W

Tstg Storage temperature range -65     150

 

 

 

 

 

 

 

 

 


(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the devic at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input and output negative-voltage ratings may be exceeded if the input and output current ratings are observed.
(3) The value of VCC is provided in the recommended operating conditions table.
(4) The package thermal impedance is calculated in accordance with JESD 51-7.




Description

The SN74LVC1G06 is a single inverter buffer/driver that is designed for 1.65-V to 5.5-V VCC operation.

NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.

The SN74LVC1G06 output of the SN74LVC1G06 device is open drain and can be connected to other open-drain outputs to implement active-low wired-OR or active-high wired-AND functions. The maximum sink current is 32 mA.

This device SN74LVC1G06 is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.


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