SN74LVT8996DWR

The SN74LVT8996DWR is one member of the SN74LVT8996 family which is designed as the 10-bit addressable scan ports (ASP) that supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. This device also supports three dedicated addresses that can be received globally (that is, to which all ASPs respond) during shadow protocols.

Features of the SN74LVT8996DWR are:(1)extend scan access from board level to higher levels of system integration; (2)promote reuse of lower-level (chip/board) tests in system environment; (3)switch-based architecture allows direct connect of primary TAP to secondary TAP; (4)primary TAP Is multidrop for minimal use of backplane wiring channels; (5)simple addressing (shadow) protocol is received / acknowledged on primary TAP; (6)10-bit address space provides for up to 1021 user-specified board addresses; (7)connect (CON) pin provides indication of primary-to-secondary connection; (8)high-drive outputs (-32-mA IOH, 64-mA IOL) support backplane interface at primary and high fanout at secondary; (9)latch-up performance exceeds 100 mA per JESD 78, class II.

The absolute maximum ratings of the SN74LVT8996DWR can be summarized as:(1)Supply voltage range, VCC: -0.5 V to 4.6 V;(2)Input voltage range, VI: -0.5 V to 7 V;(3)Voltage range applied to any output in the high-impedance or power-off state, VO: -0.5 V to 7 V;(4)Current into any output in the low state, IO: 128 mA;(5)Current into any output in the high state, IO: 64 mA;(6)Input clamp current, IIK (VI < 0): 50 mA;(7)Output clamp current, IOK (VO < 0): 46 or 88°C/W;(8)Storage temperature range: -65°C to 150°C. If you want to know more information about it, please download the datasheet in www.seekic.com or www.chinaicmart.com .