STD40NF06

Features: ` TYPICAL RDS(on) = 0.024 ` EXCEPTIONAL dv/dt CAPABILITY` 100% AVALANCHE TESTED` SURFACE-MOUNTING DPAK (TO-252) POWER PACKAGE IN TAPE & REEL (SUFFIX T4 )Application·HIGH CURRENT, HIGH SWITCHING SPEED·MOTOR CONTROL , AUDIO AMPLIFIERS·SOLENOID AND RELAY DRIVERS·DC-DC & DC-AC CONV...

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SeekIC No. : 004507486 Detail

STD40NF06: Features: ` TYPICAL RDS(on) = 0.024 ` EXCEPTIONAL dv/dt CAPABILITY` 100% AVALANCHE TESTED` SURFACE-MOUNTING DPAK (TO-252) POWER PACKAGE IN TAPE & REEL (SUFFIX T4 )Application·HIGH CURRENT, HIG...

floor Price/Ceiling Price

Part Number:
STD40NF06
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/12/23

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Product Details

Description



Features:

 ` TYPICAL RDS(on) = 0.024
 ` EXCEPTIONAL dv/dt CAPABILITY
 ` 100% AVALANCHE TESTED
 ` SURFACE-MOUNTING DPAK (TO-252)
     POWER PACKAGE IN TAPE & REEL (SUFFIX "T4")



Application

 ·HIGH CURRENT, HIGH SWITCHING SPEED
 ·MOTOR CONTROL , AUDIO AMPLIFIERS
 ·SOLENOID AND RELAY DRIVERS
 ·DC-DC & DC-AC CONVERTERS



Specifications

Symbol Parameter
Value
Unit
VDS Collector-Source Voltage (VGS = 0 V)
60
V
VDGR Drain-gate Voltage (RGS = 20 k)

60

V
VGS Gate-Source Voltage
±20
V
ID Drain Current (continuous) at TC = 25
40
A
ID Drain Current (continuous) at TC = 100
28
A
IDM(`) Drain Current (pulsed)
160
A
Ptot Total Dissipation at TC = 25
85
W
  Derating Factor
0.57
W/
dv/dt(1) Peak Diode Recovery voltage slope
10
V/ns
EAS(2) Single Pulse Avalanche Energy
250
mJ
Tstg Storage Temperature
-55 to 175
Tj Max. Operating Junction Temperature
(`) Pulse width limited by safe operating area
(1) ISD 40 A, di/dt 300 A/s, VDD V(BR)DSS, Tj TJMAX
(2) Starting Tj = 25 ,ID = 20 A, VDD = 30 V



Description

This STD40NF06 Power MOSFET is the latest development of STMicroelectronis unique "Single Feature Size™" stripbased process. The resulting transistor shows extremely high packing density for low on-resistance, rugged avalanche characteristics and less critical alignment steps therefore a remarkable manufacturing reproducibility.




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