STN2NE10

MOSFET N-Ch 100 Volt 2 Amp

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SeekIC No. : 00159848 Detail

STN2NE10: MOSFET N-Ch 100 Volt 2 Amp

floor Price/Ceiling Price

Part Number:
STN2NE10
Mfg:
STMicroelectronics
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/12/24

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Product Details

Quick Details

Transistor Polarity : N-Channel Drain-Source Breakdown Voltage : 100 V
Gate-Source Breakdown Voltage : +/- 20 V Continuous Drain Current : 2 A
Resistance Drain-Source RDS (on) : 0.4 Ohms Configuration : Single Dual Drain
Maximum Operating Temperature : + 150 C Mounting Style : SMD/SMT
Package / Case : SOT-223 Packaging : Reel    

Description

Transistor Polarity : N-Channel
Gate-Source Breakdown Voltage : +/- 20 V
Mounting Style : SMD/SMT
Packaging : Reel
Drain-Source Breakdown Voltage : 100 V
Maximum Operating Temperature : + 150 C
Package / Case : SOT-223
Configuration : Single Dual Drain
Resistance Drain-Source RDS (on) : 0.4 Ohms
Continuous Drain Current : 2 A


Features:

 TYPICAL RDS(on) = 0.33
EXCEPTIONAL dv/dt CAPABILITY
AVALANCHE RUGGED TECHNOLOGY
 100 % AVALANCHE TESTED
APPLICATION ORIENTED CHARACTERIZATION



Application

DC MOTOR CONTROL (DISK DRIVES,etc.)
DC-DC & DC-AC CONVERTERS
SYNCHRONOUS RECTIFICATION



Specifications

Symbol Parameter Value Unit
VDS Drain-source Voltage (VGS = 0) 100 V
VDGR Drain-gate Voltage (RGS = 20 k ) 100 V
VGS Gate- source Voltage ± 20 V
ID Drain Current (continuos) at TC = 25
2
A
ID Drain Current (continuos) at TC = 100 1.3 A
IDM() Drain Current (pulsed) 8 A
PTOT Total Dissipation at TC = 25 2.5 W
  Derating Factor 0.02 W/
dv/dt(1) Peak Diode Recovery voltage slope 6 mJ
Tstg Storage Temperature 65 to 150
Tj Max. Operating Junction Temperature 150



Description

This Power Mosfet is the latest development of STN2NE10 STMicroelectronics unique "Single Feature SizeÔ " stip-based process. The resulting transistor shows extremely high packing density for low on-resistance, rugged avalanche characteristics and less critical alignment steps therefore a remarkable manufacturing reproducibility.




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