Features: SpecificationsDescription Here is the description about 2FAH-C20R Series of the Integrated Passive & Active Device using CSP. This application specific integrated passive component is designed to provide all of the necessary ESD protection and line resistance required on the data por...
2FAH-C20R Series: Features: SpecificationsDescription Here is the description about 2FAH-C20R Series of the Integrated Passive & Active Device using CSP. This application specific integrated passive component is ...
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Here is the description about 2FAH-C20R Series of the Integrated Passive & Active Device using CSP. This application specific integrated passive component is designed to provide all of the necessary ESD protection and line resistance required on the data port of a custom portable electronic device. The ESD protection provided by the component enables the data port to withstand ±8 KV Contact / ±15 KV Air Discharge when tested according to the method specified in IEC 61000-4-2. The component incorporates 7 identical channels and is supplied in a 20 pin CSP package which is intended to be mounted directly onto an FR4 printed circuit board. 2FAH-C20R Series will meet typical thermal cycle and bend test specifica-tions without the use of an underfill material.
Here are the features: Lead free versions available; RoHS compliant (lead free version); New Product Development; Integrated Passive Device; ESD Protection to IEC61000-4-2 Spec.
And here are the Electrical Characteristics (Ta =25°C). Zener Diode Breakdown Voltage @ 1 mA is from 6 to 8V. The Leakage Current @ 3V is at max 1uA. The Contact Discharge is from min ±8kV to max. The Air Discharge is from min ±15kV to max. The Contact Discharge is ±150V. The Air Discharge is ±150V. The Operating Temperature is from -40 to +8°C. The Storage Temperature is from -60 to +125°C. The Total Power Dissipation @ 70 °C is 100mW.
Here are the notes. 1. The IEC 61000-4-2 test method will be adapted for component level testing. The device will provide the specified ESD protection performance on the "IN 1-7" pins only. 2. "Let Through" is a measure of the component of an incident ESD transient that the protection device allows through to the down stream circuitry.
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