SN74ABT18245A

Supply voltage range, V_CC . . . . . . . . . . . . . . . . . . . . . . . . . .0.5 V to 7 V
Input voltage range, V_I (except I/O ports) (see Note 1) .     0.5 V to 7 V
Input voltage range, V_I (I/O ports) (see Note 1) . . . . . . . 0.5 V to 5.5 V
Voltage range applied to any output in the high state or
power-off state, V_O . . . . . . . . . . . . . . . . . . . . . . . . . .        0.5 V to 5.5 V
Current into any output in the low state, I_O: SN54ABT18245A . . . . 96 mA
SN74ABT18245A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .              128 mA
Input clamp current, I_IK (V_I < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . 18 mA
Output clamp current, I_OK (V_O < 0) . . . . . . . . . . . . . . . . . . . . . . .  50 mA
Continuous current through V_CC . . . . . . . . . . . . . . . . . . . . . . . . .   576 mA
Continuous current through GND . . . . . . . . . . . . . . . . . . . . . . . . . 1152 mA
Package thermal impedance, qJA (see Note 2): DGG package . . . . 81/W
DL package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .                    74/W
Storage temperature range, T_stg . . . . . . . . . . . . . . . . . . . 65 to 150

Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings can be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.

The 'ABT18245A scan test devices with 18-bit bus transceivers are members of the Texas Instruments SCOPEE testability integratedcircuit family. This 'ABT18245A family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these 'ABT18245A devices are 18-bit noninverting bus transceivers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPEE bus transceivers. Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. OE can be used to disable the device so that the buses are effectively isolated.

In the test mode, the normal operation of the 'ABT18245A SCOPEE bus transceivers is inhibited and the test circuitry is enabled to observe and control the input/output (I/O) boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.