80C31BH

Features: High Performance CHMOS EPROM24 MHz OperationImproved Quick-Pulse Programming Algorithm3-Level Program Memory LockBoolean Processor128-Byte Data RAM32 Programmable IO LinesTwo 16-Bit TimerCountersExtended Temperature Range( 40to 85)5 Interrupt SourcesProgrammable Serial PortTTL- and CMOS-...

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SeekIC No. : 004253693 Detail

80C31BH: Features: High Performance CHMOS EPROM24 MHz OperationImproved Quick-Pulse Programming Algorithm3-Level Program Memory LockBoolean Processor128-Byte Data RAM32 Programmable IO LinesTwo 16-Bit TimerC...

floor Price/Ceiling Price

Part Number:
80C31BH
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/3/28

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Product Details

Description



Features:

High Performance CHMOS EPROM
24 MHz Operation
Improved Quick-Pulse Programming Algorithm
3-Level Program Memory Lock
Boolean Processor
128-Byte Data RAM
32 Programmable IO Lines
Two 16-Bit TimerCounters
Extended Temperature Range( 40to 85)
5 Interrupt Sources
Programmable Serial Port
TTL- and CMOS-Compatible Logic Levels
64K External Program Memory Space
64K External Data Memory Space
ONCE Mode Facilitates System Testing
Power Control Modes
   -Idle
   -Power Down



Pinout

  Connection Diagram  Connection Diagram


Specifications

Ambient TemperatureUnderBias .............-40to 85
Storage Temperature ...........................-65to 150
Voltage onEAVPP Pinto VSS......................  0V to 130V
Voltage on Any Other Pinto VSS ..............-0.5V to 65V
Maximum IOL perIOPin .......................................15mA
Power Dissipation.................................................15W
(Based on package heat transfer limitations not de-vice power consumption)
NOTICE This data sheet contains preliminary infor-mation on new products in production It is valid for the devices indicated in the revision history The specifications are subject to change without notice
WARNING Stressing the device beyond the ''Absolute Maximum Ratings'' may cause permanent damage These are stress ratings only Operation beyond the''Operating Conditions'' is not recommended and ex-tended exposure beyond the ''Operating Conditions''may affect device reliability




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