CY7C1313V18 General Description
CY7C1313V18 Maximum Ratings
(Above which the useful life may be impaired.)
Storage Temperature .................................65°C to +150°C
Ambient Temperature with Power Applied ..55°C to +125°C
Supply Voltage on VDD Relative to GND............. 0.5V to +2.9V
DC Applied to Outputs in High-Z .............0.5V to VDDQ + 0.5V
DC Input Voltage[14] ............................. 0.5V to VDDQ + 0.5V
CY7C1313V18 Features
• Separate Independent Read and Write Data Ports
- Supports concurrent transactions
• 250-MHz Clock for High Bandwidth
• 4-Word Burst for reducing address bus frequency
• Double Data Rate (DDR) interfaces on both Read and Write Ports (data transferred at 500 MHz) at 250 MHz
• Two input clocks (K and K) for precise DDR timing
- SRAM uses rising edges only
• Two output clocks (C and C) accounts for clock skew and flight time mismatching
• Echo clocks (CQ and CQ) simplify data capture in high speed systems
• Single multiplexed address input bus latches address inputs for both Read and Write ports
• Separate Port Selects for depth expansion
• Synchronous internally self-timed writes
• Available in *8, *18, and *36 configurations
• Full data coherancy providing most current data
• Core Vdd=1.8(±0.1V);I/O Vddq=1.4V to Vdd)
• 13 * 15 x 1.2 mm 1.0-mm pitch FBGA package, 165-ball (11 * 15 matrix)
• Variable drive HSTL output buffers
• JTAG 1149.1-compatible test access port
• Delay Lock Loop (DLL) for accurate data placement
Map list: ABCDEFGHIJKLMNOPQRSTUVWXYZ 0123456789All