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Part Number: IDT74AUC16374
Description: This 16-bit edge-triggered D-type flip-flop is built using advanced CMOS technology. The AUC16...


Description: This 16-bit edge-triggered D-type flip-flop is built using advanced CMOS technology. The AUC16...
This 16-bit edge-triggered D-type flip-flop is built using advanced CMOS technology.
The AUC16374 is particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers. It can be used as two 8-bit flip-flops or one 16-bit flip-flop. On the positive transition of the clock (CLK) input, the Q outputs of the flip-flop take on the logic levels at the data (D) inputs. OE can be used to place the eight outputs in either a normal logic state (high or low logic levels) or a high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and the increased drive provide the capability to drive bus lines without need for interface or pullup components. OE does not affect the internal operation of the flip-flop.
Old data can be retained or new data can be entered while the outputs are in the high-impedance state. This device is fully specified for partial power-down applications using IOFF. The IOFF circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
To ensure the high-impedance state during power up or power down, OE should be tied to VDD through a pull-up resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
|
Description |
Symbol |
Max |
unit |
|
Terminal Voltage with Respect to GND |
VTERM(2) |
0.5 to +4.6
|
V |
|
Terminal Voltage with Respect to GND |
VTERM(3)
|
0.5 to VCC+0.5 |
V |
|
Storage Temperature |
TSTG |
65 to +150
|
° C |
|
DC Output Current |
IOUT
|
50 to +50 |
mA |
|
Continuous Clamp Current, VI < 0 or VI > VCC |
IIK |
±50
|
mA |
|
Continuous Clamp Current, VO < 0 |
IOK |
50 |
mA |
|
Continuous Current through each VCC or GND |
ICC ISS |
±100 |
mA |
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
IDT74AUC16374
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