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K4X56163PE-L(F)G

Features: • 1.8V power supply, 1.8V I/O power• Double-data-rate architecture; two data transfers per clock cycle• Bidirectional data strobe(DQS)• Four banks operation• Differential clock inputs(CK and CK)• MRS cycle with address key programs- CAS Latency ( 3 )- ...

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SeekIC No. : 004383085 Detail

K4X56163PE-L(F)G: Features: • 1.8V power supply, 1.8V I/O power• Double-data-rate architecture; two data transfers per clock cycle• Bidirectional data strobe(DQS)• Four banks operation• ...

K4X56163PE-L(F)G Data Sheet

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Part Number:
K4X56163PE-L(F)G
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• 1.8V power supply, 1.8V I/O power
• Double-data-rate architecture; two data transfers per clock cycle
• Bidirectional data strobe(DQS)
• Four banks operation
• Differential clock inputs(CK and CK)
• MRS cycle with address key programs
- CAS Latency ( 3 )
- Burst Length ( 2, 4, 8 )
- Burst Type (Sequential & Interleave)
- Partial Self Refresh Type ( Full, 1/2, 1/4 array )
- Internal Temperature Compensated Self Refresh
- Driver strength ( 1, 1/2, 1/4, 1/8 )
• All inputs except data & DM are sampled at the positive going edge of the system clock(CK).
• Data I/O transactions on both edges of data strobe, DM for masking.
• Edge aligned data output, center aligned data input.
• No DLL; CK to DQS is not synchronized.
• LDM/UDM for write masking only.
• 7.8us auto refresh duty cycle.
• CSP package.


Specifications

Parameter Symbol Value Unit
oltage on any pin relative to VSS VIN, VOUT -0.5 ~ 2.7 V
Voltage on VDD supply relative to VSS VDD -0.5 ~ 2.7 V
Voltage on VDDQ supply relative to VSS VDDQ -0.5 ~ 2.7 V
Storage temperature TSTG -55 ~ +150 °C
Power dissipation PD 1.0 W
Short circuit current IOS 50 mA

Note :
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommend operation condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.




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