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Part Number: M58LR128KT

 

 

 

 

Description: The M58LR128KT/B and M58LR256KT/B are 128 Mbit (8 Mbit *16) and 256 Mbit (16 Mbit *16) non-volatile Fl...


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M58LR128KT General Description


The M58LR128KT/B and M58LR256KT/B are 128 Mbit (8 Mbit *16) and 256 Mbit (16 Mbit *16) non-volatile Flash memories, respectively. They can be erased electrically at block level and programmed in-system on a word-by-word basis using a 1.7 V to 2.0 V VDD supply for the circuitry and a 1.7 V to 2.0 V VDDQ supply for the input/output pins. An optional 9 V VPP power supply is provided to accelerate factory programming.

The devices feature an asymmetrical block architecture:
The M58LR128KT/B have an array of 131 blocks, and are divided into 8 Mbit banks. There are 15 banks each containing 8 main blocks of 64 Kwords, and one parameter bank containing 4 parameter blocks of 16 Kwords and 7 main blocks of 64 Kwords.
The M58LR256KT/B have an array of 259 blocks, and are divided into 16 Mbit banks.
There are 15 banks each containing 16 main blocks of 64 Kwords, and one parameter bank containing 4 parameter blocks of 16 Kwords and 15 main blocks of 64 Kwords.

The multiple bank architecture allows dual operations. While programming or erasing in one bank, read operations are possible in other banks. Only one bank at a time is allowed to be in program or erase mode. It is possible to perform burst reads that cross bank boundaries.

The bank architecture is summarized in Table 2, and the memory map is shown in Figure 2.

The parameter blocks are located at the top of the memory address space for the M58LR128KT and M58LR256KT, and at the bottom for the M58LR128KB and M58LR256KB.

Each block can be erased separately. Erase can be suspended to perform a program or read operation in any other block, and then resumed. Program can be suspended to read data at any memory location except for the one being programmed, and then resumed.

Each block can be programmed and erased over 100 000 cycles using the supply voltage VDD. There is a buffer enhanced factory programming command available to speed up programming.

Program and erase commands are written to the command interface of the memory. An internal Program/Erase Controller manages the timings necessary for program and erase operations. The end of a program or erase operation can be detected and any error conditions identified in the Status Register. The command set required to control the memory is consistent with JEDEC standards.

The device supports synchronous burst read and asynchronous read from all blocks of the memory array; at power-up the device is configured for asynchronous read. In synchronous burst read mode, data is output on each clock cycle at frequencies of up to 66 MHz. The synchronous burst read operation can be suspended and resumed.

The device features an automatic standby mode. When the bus is inactive during asynchronous read operations, the device automatically switches to automatic standby ode. In this condition the power consumption is reduced to the standby value and the outputs are still driven.

The M58LRxxxKT/B features an instant, individual block locking scheme that allows any block to be locked or unlocked with no latency, enabling instant code and data protection. All blocks have three levels of protection. They can be locked and locked-down individually preventing any accidental programming or erasure. There is an additional hardware protection against program and erase. When VPP VPPLK all blocks are protected against program or erase. All blocks are locked at power-up.

M58LR128KT Maximum Ratings

Symbol Parameter Value Unit
Min Max
TA

TBIAS

TSTG

VIO

VDD

VDDQ

VPP

IO

tVPPH
Ambient operating temperature

Temperature under bias

Storage temperature

Input or output voltage

Supply voltage

Input/output supply voltage

Program voltage

Output short circuit current

Time for VPP at VPPH
25

25

65

0.5

0.2

0.2

0.2





85

85

125

VDDQ + 0.6

2.5

2.5

10

100

100
°C

°C

°C

V

V

V

V

mA

hours


M58LR128KT Features

Supply voltage
VDD = 1.7 V to 2.0 V for program, erase and read
VDDQ = 1.7 V to 2.0 V for I/O buffers
VPP = 9 V for fast program
Synchronous/asynchronous read
Synchronous burst read mode:
54 MHz, 66 MHz
Asynchronous page read mode
Random access: 70 ns, 85 ns
Synchronous burst read suspend
Programming time
2.5 s typical word program time using Buffer Enhanced Factory Program command
Memory organization
Multiple bank memory array:
8 Mbit banks for the M58LR128KT/B
16 Mbit banks for the M58LR256KT/B
Parameter blocks (top or bottom location)
Dual operations
Program/erase in one bank while read in others
No delay between read and write operations
Block locking
All blocks locked at power-up
Any combination of blocks can be locked with zero latency
WP for block lock-down
Absolute write protection with VPP = VSS
Security
64 bit unique device number
2112 bit user programmable OTP cells
Common Flash interface (CFI)
100 000 program/erase cycles per block
Electronic signature
Manufacturer code: 20h
Top device codes:
M58LR128KT: 88C4h
M58LR256KT: 880Dh
Bottom device codes
M58LR128KB: 88C5h
M58LR256KB: 880Eh

M58LR128KT datasheet

M58LR128KT705
PDF/DataSheet Download

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