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NTR4101P

Features: • Leading −20 V Trench for Low RDS(on)• −1.8 V Rated for Low Voltage Gate Drive• SOT−23 Surface Mount for Small Footprint• Pb−Free Package is AvailableApplication• Load/Power Management for Portables• Load/Power Management for C...

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SeekIC No. : 004436698 Detail

NTR4101P: Features: • Leading −20 V Trench for Low RDS(on)• −1.8 V Rated for Low Voltage Gate Drive• SOT−23 Surface Mount for Small Footprint• Pb−Free Package i...

NTR4101P Data Sheet

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Part Number:
NTR4101P
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/4/27

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Product Details

Description



Features:

• Leading −20 V Trench for Low RDS(on)
• −1.8 V Rated for Low Voltage Gate Drive
• SOT−23 Surface Mount for Small Footprint
• Pb−Free Package is Available


Application

• Load/Power Management for Portables
• Load/Power Management for Computing
• Charging Circuits and Battery Protection


Pinout

Connection Diagram


Specifications

Parameter Symbol Value Units
Drain−to−Source Voltage VDSS -20 V
Gate−to−Source Voltage VGS ±8 V
Continuous Drain
Current (Note 1)		 Steady
State		 TA = 25 °C ID -2.4 A
TA = 85°C -1.7
tp10 s TA = 25 °C -3.2
Power Dissipation
(Note 1)		 Steady State TA = 25 °C Pd 0.73 W
tp10 s 1.25
Continuous Drain
Current (Note 2)		 Steady
State		 TA = 25 °C ID -1.8 A
TA = 85 °C -1.3
Power Dissipation
(Note 2)		 TA = 25 °C Pd 0.42 W
Pulsed Drain Current tp = 10 s IDM -7.5 A
ESD Capability (Note 3) C = 100 pF,
RS = 1500 		 ESD 225  
Operating Junction and Storage Temperature TJ, Tstg −55 to
150		 °C
Source Current (Body Diode) Ls -2.4 A
Lead Temperature for Soldering Purposes
(1/8" from case for 10 s)		 TL 260 °C
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.


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