Features: • ESD classification testing is done to JEDEC Standard JESD22. Protection exceeds 2000 V to HBM per method A114.• Latch-up testing is done to JEDEC Standard JESD78 which exceeds 100 mA• Optimized for clock distribution in DDR (Double Data Rate) SDRAM applications as per...
PCKV857: Features: • ESD classification testing is done to JEDEC Standard JESD22. Protection exceeds 2000 V to HBM per method A114.• Latch-up testing is done to JEDEC Standard JESD78 which exceed...
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SYMBOL |
PARAMETER |
CONDITION |
LIMITS
|
UNIT
| |
MIN |
MAX | ||||
VDDQ |
Supply voltage range |
0.5 |
3.6 |
V | |
AVDD |
Supply voltage range |
0.5 |
3.6 |
V | |
VI |
Input voltage range |
see Notes 2 and 3 |
0.5 |
VDDQ + 0.5 |
V |
VO |
Output voltage range |
see Notes 2 and 3 |
-0.5 |
VDDQ + 0.5 |
V |
IIK |
Input clamp current |
VI < 0 or VI >VDDQ |
- |
±50 |
mA |
IOK |
Output clamp current |
VO < 0 or VO >VDDQ |
- |
±50 |
mA |
IO |
Continuous output current |
VO = 0 to VDDQ |
±50 |
mA | |
Continuous current to GND or VDDQ |
- |
±100 |
mA | ||
Ptot |
Storage temperature range |
-65 |
+150 |
°C |
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
3. This value is limited to 3.6 V maximum.
The PCKV857 is a high-performance, low-skew, low-jitter zero delay buffer designed for 2.5 V VDD and 2.5 V AVDD operation and differential data input and output levels.
The PCKV857 is a zero delay buffer that distributes a differential clock input pair (CLK, CLK) to ten differential pairs of clock outputs (Y[0:9], Y[0:9]) and one differential pair feedback clock outputs (FBOUT, FBOUT) . The clock outputs are controlled by the clock inputs (CLK, CLK), the feedback clocks (FBIN, FBIN), and the analog power input (AVDD). When PWRDWN of PCKV857 is high, the outputs switch in phase and frequency with CLK. When PWRDWN is low, all outputs are disabled to high impedance state (3-State), and the PLL is shut down (low power mode). The device also enters the low power mode when the input frequency falls below 20 MHz. An input frequency detection circuit will detect the low frequency condition and after applying a > 20 MHz input signal, the detection circuit turns on the PLL again and enables the outputs. When AVDD is grounded, the PLL is turned off and bypassed for test purposes. The PCKV857 is also able to track spread spectrum clocking for reduced EMI.
The PCKV857 is characterized for operation from 0 to +70 °C.