SN54BCT8374A General Description
The 'BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE(TM) testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the 'F374 and 'BCT374 octal D-type flip-flops.The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE(TM) octal flip-flops.
SN54BCT8374A Maximum Ratings
Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-0.5 V to 7 V
Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5 V to 7 V
TMS (see Note 1) . . . . . . . . . . . . . . . . . . . . . . 0.5 V to 12 V
Voltage range applied to any output in the high or
power-off state, . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5 V to 5.5 V
Voltage range applied to any output in the high state . . . . . . . . . . . 0.5 V to VCC
Input clamp current, IIK . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .30 mA
Current into any output in the low state:SN54BCT8374A (TDO) . . . . . . . . . 40 mA
SN54BCT8374A (any Q) . . . . . . . . 96 mA
SN74BCT8374A (TDO) . . . . . . .. . . 48 mA
SN74BCT8374A (any Q) . .. . . . . . 128 mA
Maximum power dissipation at TA = 55 (in still air) (see Note 2):DW package .1.7 W
NT package . 1.3 W
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65 to 150
SN54BCT8374A Connection Diagram
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