SN74ABTH18504A

Pinout

Specifications

Supply voltage range, V_CC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-0.5 V to 7 V
Input voltage range, V_I :except I/O ports (see Note 1). . . . . . . . . . . . . -0.5 V to 7 V
                                       I/O ports (see Note 1)  . . . . . . . . . . . .  . . . 0.5 V to 5.5 V
Voltage range applied to any output in the high or power-off state, V_O  . . . . . . . .
                                                                      . . . . . . . . . . . . . . . . . . . -0.5 V to 5.5 V
Current into any output in the low state, I_O : SN54ABTH18504A . . . .  . . . . . .96 mA
                                                                SN54ABTH182504A (A port or TDO) .96 mA
                                                                SN54ABTH182504A (B port)  . . . . . .30 mA
                                                                SN74ABTH18504A . . . . . . . . . ... .. .128 mA 
                                                                SN74ABTH182504A (A port or TDO) 128 mA
                                                                SN74ABTH182504A (B port) . . . . . . .30 mA
Input clamp current, I_IK (V_I< 0)  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-18 mA
Output clamp current, I_OK(V_O < 0)   . . . . . . . . . . . . . . . . . . . . . . . . .  . . . . . . .-50 mA
Continuous current through V_CC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .576 mA
Continuous current through GND  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  1152 mA
Maximum power dissipation at T_A = 55 (in still air) (see Note 2):PM package  .  1 W
Storage temperature range, T_stg  . . . . . . . . . . . . . . . . . . . .  . . . . . . . 65 to 150


Description

The 'ABTH18504A and 'ABTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPE(TM) testability integrated-circuit family. This 'ABTH18504A and 'ABTH182504A  family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these 'ABTH18504A and 'ABTH182504A  devices are 20-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE^(TM) universal bus transceivers.