Features: ` Available in the Texas Instruments NanoStar™ and NanoFree™ Packages ` ±8-mA Output Drive at 1.8 V ` Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II` Optimized for 1.8-V Operation and Is 3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation` Ioff Supports Parti...
SN74AUC2G34: Features: ` Available in the Texas Instruments NanoStar™ and NanoFree™ Packages ` ±8-mA Output Drive at 1.8 V ` Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II` Optimized for 1...
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` Available in the Texas Instruments NanoStar™ and NanoFree™ Packages
` ±8-mA Output Drive at 1.8 V
` Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
` Optimized for 1.8-V Operation and Is 3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation
` Ioff Supports Partial-Power-Down Mode
` ESD Protection Exceeds JESD 22 Operation
1000-V Charged-Device Model (C101)
2000-V Human-Body Model (A114-A)
200-V Machine Model (A115-A) Operation
` Sub-1-V Operable
` Max tpd of 1.6 ns at 1.8 V
` Low Power Consumption, 10 mA at 1.8 V

| MIN | MAX | UNIT | |||
| VCC | Supply voltage range | 0.5 | 3.6 | V | |
| VI | Input voltage range(2) | 0.5 | 4.1 | V | |
| VO | Voltage range applied to any output in the high-impedance or power-off state(2) | 0.5 | 4.1 | V | |
| VO | Output voltage range applied in the high or low state(2) | 0.5 | VCC + 0.5 | V | |
| IIK | Input clamp current | VI < 0 | 50 | mA | |
| IOK | Output clamp current | VO < 0 | - 50 | mA | |
| IO | Continuous output current | ±20 | mA | ||
| Continuous current throughVCC or GND | ±100 | mA | |||
| JA | Package thermal impedance (3) | DGG package | 165 | °C/W | |
| DGV package | 259 | ||||
| GQL package | 142 | ||||
| YEP/YZP package | 123 | ||||
| Tstg | Storage temperature range | 65 | 150 | °C | |
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
(3) The package thermal impedance is calculated in accordance with JESD 51-7.