SST39VF1602

• Organized as 1M x16: SST39VF1601/1602 2M x16: SST39VF3201/3202  4M x16: SST39VF6401/6402
• Single Voltage Read and Write Operations 2.7-3.6V
• Superior Reliability Endurance: 100,000 Cycles (Typical) Greater than 100 years Data Retention
• Low Power Consumption (typical values at 5 MHz) Active Current: 9 mA (typical) Standby Current: 3 A (typical) Auto Low Power Mode: 3 A (typical)
• Hardware Block-Protection/WP# Input Pin Top Block-Protection (top 32 KWord) for SST39VF1602/3202/6402 Bottom Block-Protection (bottom 32 KWord) for SST39VF1601/3201/6401
• Sector-Erase Capability Uniform 2 KWord sectors
• Block-Erase Capability Uniform 32 KWord blocks

• Chip-Erase Capability
• Erase-Suspend/Erase-Resume Capabilities
• Hardware Reset Pin (RST#)

• Security-ID Feature SST: 128 bits; User: 128 bits
• Fast Read Access Time: 70 ns 90 ns
• Latched Address and Data
• Fast Erase and Word-Program: Sector-Erase Time: 18 ms (typical) Block-Erase Time: 18 ms (typical) Chip-Erase Time: 40 ms (typical) Word-Program Time: 7 s (typical)
• Automatic Write Timing Internal V_PP Generation
• End-of-Write Detection Toggle Bits Data# Polling
• CMOS I/O Compatibility
• JEDEC Standard Flash EEPROM Pinouts and command sets
• Packages Available 48-lead TSOP (12mm x 20mm) 48-ball TFBGA (6mm x 8mm) for 16M and 32M 48-ball TFBGA (8mm x 10mm) for 64M

Temperature Under Bias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55°C to +125°C
Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -65°C to +150°C
D. C. Voltage on Any Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. ... -0.5V to VDD+0.5V
Transient Voltage (<20 ns) on Any Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . .... -2.0V to VDD+2.0V
Voltage on A₉ Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .... . . . .. -0.5V to 13.2V
Package Power Dissipation Capability (Ta = 25°C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ... . . . . . . . 1.0W
Surface Mount Lead Soldering Temperature (3 Seconds) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...... . . . . . 240°C
Output Short Circuit Current¹ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...... . . . 50 mA

The SST39VF1602 devices are 1M x16, 2M x16, and 4M x16 respectively, CMOS Multi-Purpose Flash Plus (MPF+) manufactured with SST's proprietary, high performance CMOS SuperFlash technology. The split-gate cell design and thick-oxide tunneling injector attain better reliability and manufacturability compared with alternate approaches. The SST39VF160x/320x/640x write (Program or Erase) with a 2.7-3.6V power supply. These devices conform to JEDEC standard pinouts for x16 memories.

Featuring high performance Word-Program, the SST39VF1602 devices provide a typical Word-Program time of 7 sec. These devices use Toggle Bit or Data# Polling to indicate the completion of Program operation. To protect against inadvertent write, they have on-chip hardware and Software Data Protection schemes. Designed, manufactured, and tested for a wide spectrum of applications, these devices are offered with a guaranteed typical endurance of 100,000 cycles. Data retention is rated at greater than 100 years.

The SST39VF1602 devices are suited for applications that require convenient and economical updating of program, configuration, or data memory. For all system applications, they significantly improve performance and reliability, while lowering power consumption. They inherently use less energy during Erase and Program than alternative flash technologies. The total energy consumed is a function of the applied voltage, current, and time of application. Since for any given voltage range, the SuperFlash technology uses less current to program and has a shorter erase time, the total energy consumed during any Erase or Program operation is less than alternative flash technologies. These devices also improve flexibility while lowering the cost for program, data, and configuration storage applications.

The SuperFlash technology provides fixed Erase and Program times, independent of the number of Erase/Program cycles that have occurred. Therefore the system software or hardware does not have to be modified or de-rated as is necessary with alternative flash technologies, whose Erase and Program times increase with accumulated Erase/Program cycles.