ST95022

Features: `HIGH SPEED CLOCK RATE: 2.1 MHz Max`1,000,000 ERASE/WRITE CYCLES`40 YEARS DATA RETENTION`SINGLE 4.5V to 5.5V SUPPLY VOLTAGE`SPI BUS COMPATIBLE SERIAL INTERFACE`BLOCK WRITE PROTECTION`STATUS REGISTER`16 BYTE PAGE MODE`WRITE PROTECT`SELF-TIMED PROGRAMMING CYCLE`E.S.D.PROTECTION GREATER th...

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ST95022 Picture
SeekIC No. : 004506931 Detail

ST95022: Features: `HIGH SPEED CLOCK RATE: 2.1 MHz Max`1,000,000 ERASE/WRITE CYCLES`40 YEARS DATA RETENTION`SINGLE 4.5V to 5.5V SUPPLY VOLTAGE`SPI BUS COMPATIBLE SERIAL INTERFACE`BLOCK WRITE PROTECTION`STAT...

floor Price/Ceiling Price

Part Number:
ST95022
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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268 Transactions

Rating

evaluate  (4.8 stars)

Upload time: 2024/5/16

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Product Details

Description



Features:

`HIGH SPEED CLOCK RATE:
   2.1 MHz Max
`1,000,000 ERASE/WRITE CYCLES
`40 YEARS DATA RETENTION
`SINGLE 4.5V to 5.5V SUPPLY VOLTAGE
`SPI BUS COMPATIBLE SERIAL INTERFACE
`BLOCK WRITE PROTECTION
`STATUS REGISTER
`16 BYTE PAGE MODE
`WRITE PROTECT
`SELF-TIMED PROGRAMMING CYCLE
`E.S.D.PROTECTION GREATER than 4000V
`SUPPORTS POSITIVE CLOCK SPI MODES



Pinout

  Connection Diagram


Specifications

Symbol
Parameter
Value
Unit
TA
Ambient Operating Temperature (2)
40 to 125
°C
TSTG
Storage Temperature
65 to 125
°C
TLEAD
Lead Temperature, Soldering (SO8 package) 40 sec
215
°C
VO
Output Voltage
0.3 to VCC +0.6
V
VI
Input Voltage with respect to Ground
0.3 to 6.5
V
VCC
Supply Voltage
0.3 to 6.5
V
VESD
Electrostatic Discharge Voltage (Human Body model) (3)
4000
V
Electrostatic Discharge Voltage (Machine model) (4)
500
V



Description

The ST95022 is an high speed 2 Kbit Electrically Erasable Programmable Memory (EEPROM) fabricated with STMicroelectronics's High Endurance Single Polysilicon CMOS technology. The memory is accessed by a simple SPI bus compatible serial interface. The bus signals are a serial clock input (C), a serial data input (D) and a serial data output (Q).


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