STP60NE10

MOSFET N-Ch 100 Volt 60 Amp

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SeekIC No. : 00164521 Detail

STP60NE10: MOSFET N-Ch 100 Volt 60 Amp

floor Price/Ceiling Price

Part Number:
STP60NE10
Mfg:
STMicroelectronics
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/12/24

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Product Details

Quick Details

Transistor Polarity : N-Channel Drain-Source Breakdown Voltage : 100 V
Gate-Source Breakdown Voltage : +/- 20 V Continuous Drain Current : 60 A
Resistance Drain-Source RDS (on) : 0.022 Ohms Configuration : Single
Maximum Operating Temperature : + 175 C Mounting Style : Through Hole
Package / Case : TO-220 Packaging : Tube    

Description

Transistor Polarity : N-Channel
Gate-Source Breakdown Voltage : +/- 20 V
Configuration : Single
Maximum Operating Temperature : + 175 C
Drain-Source Breakdown Voltage : 100 V
Mounting Style : Through Hole
Packaging : Tube
Package / Case : TO-220
Continuous Drain Current : 60 A
Resistance Drain-Source RDS (on) : 0.022 Ohms


Features:

 TYPICAL RDS(on) = 0.016
EXCEPTIONAL dv/dt CAPABILITY
100% AVALANCHE TESTED
APPLICATIONORIENTED CHARACTERIZATION



Application

SOLENOID AND RELAY DRIVERS
MOTOR CONTROL, AUDIO AMPLIFIERS
DC-DC CONVERTERS
AUTOMOTIVE ENVIRONMENT (INJECTION, ABS, AIR-BAG, LAMPDRIVERS, Etc.)



Specifications

Symbol
Parameter
Value
Unit
STP60NE10 STP60NE10FP
VDS
Drain-source Voltage (VGS = 0)
100
V
VDGR
Drain- gate Voltage (RGS = 20 k)
100
V
VGS
Gate-source Voltage
±20
V
ID
Drain Current (continuous) at Tc = 25 60
30
A
ID
Drain Current (continuous) at Tc = 100 42
21
A
IDM(`)
Drain Current (pulsed) 240
120
A
Ptot
Total Dissipation at Tc = 25 160
50
W
Derating Factor 1.06
0.37
W/
VISO
Insulation Withstand Voltage (DC)
-
2000
V
dv/dt
Peak Diode Recovery voltage slope
7
V/ns
Tstg
Storage Temperature
-65 to 175
°C
Tj
Max. Operating Junction Temperature
175
°C
(•) Pulse width limited by safe operating area ( 1) ISD 60 A, di/dt 300 A/ms, VDD V(BR)DSS, Tj TJMAX


Description

This Power MOSFET STP60NE10 is the latest development of STMicroelectronics unique "Single Feature Size]" strip-based process. The resulting transistor shows extremely high packing density for low on-resistance, rugged avalanche characteristics and less critical alignment steps therefore a remarkable manufacturing reproducibility.




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