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TA75W01FU

Features: · In the linear mode the input common mode voltage range includes ground.· The internally compensated operational amplifier is small package.· Low power dissipation and power drain suitable for battery operation.· Differential input voltage range equal to the power supply voltage.· Large...

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TA75W01FU: Features: · In the linear mode the input common mode voltage range includes ground.· The internally compensated operational amplifier is small package.· Low power dissipation and power drain suitabl...

TA75W01FU Data Sheet

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Part Number:
TA75W01FU
Supply Ability:
5000

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  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

·  In the linear mode the input common mode voltage range includes ground.
·  The internally compensated operational amplifier is small package.
·  Low power dissipation and power drain suitable for battery operation.
·  Differential input voltage range equal to the power supply voltage.
·  Large output voltage swing : 0VDC to 3.4VDC (VCC = 5VDC)
·  Wide power supply voltage range and single power supply is possible.
·  Single supply 3VDC to 12VDC or dual supplies ± 1.5VDC to ± 6VDC.


Pinout

Connection Diagram


Specifications

Characteristic
Symbol
Rating
Unit
Supply voltage

Differential input voltage

Input voltage

Power dissipation

Operating temperature

Storage temperature
VCC, VEE

DVIN

VIN

PD

Topr

Tstg
±6 or 12

±12

−0.3 ~VCC

250

−40~85

−55~125
V

V

V

mW

°C

°C

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).




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