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Features: • 50Ω Input Clock and Data (Differential ECL) through 2.54 mm Pitch Connectors• Demultiplexed Outputs (Single-ended ECL) 50Ω Adapted on up to 8 x 2.54 mm Pitch Connectors• DMUX Functions Adjusted by Jumpers and Potentiometers• Separated Ground and Supp...

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SeekIC No. : 004529387 Detail

TSEV81102G0TPZR3: Features: • 50Ω Input Clock and Data (Differential ECL) through 2.54 mm Pitch Connectors• Demultiplexed Outputs (Single-ended ECL) 50Ω Adapted on up to 8 x 2.54 mm Pitch Conn...

TSEV81102G0TPZR3 Data Sheet

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Part Number:: TSEV81102G0TPZR3
Supply Ability:: 5000

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Product Details

Description

Features:

• 50Ω Input Clock and Data (Differential ECL) through 2.54 mm Pitch Connectors
• Demultiplexed Outputs (Single-ended ECL) 50Ω Adapted on up to 8 x 2.54 mm Pitch Connectors
• DMUX Functions Adjusted by Jumpers and Potentiometers
• Separated Ground and Supplies
• Suitable for High-frequency Evaluation (up to 2.2 GHz) over the Military Temperature Range
• Board Dimensions: 200 mm x 190 mm
• Fully Assembled and Tested
For optimal understanding and use of this evaluation board, please refer to theTS81102G0 DMUX specification also.

Specifications

Parameter	Symbol	Comments	Values	Unit
Positive supply voltage	V_CC		GND to 6	V
Digital positive supply voltage	V_PLUSD		GND to 4	V
Negative supply voltage	V_EE		V_GND to -6	V
Analog input voltages	ADCDelAdjCtrl, ADCDelAdjCtrlb or DMUXDelAdjCtrl, DMUXDelAdjCtrlb or SwiAdj	Voltage range for each pad Differential voltage range	0 to 1 -1 to +1	V
ECL 50Ω input voltage	Clkln or Clklnb or I[0.9] or I[0.9]b or SyncReset or SyncResetb or ADCDelAdjln or ADCDelAdjlnb	Voltage range for each pad	-2.2 to 0.6	V
Maximum difference between ECL 50Ω input voltages	Clkln Clklnb or I[0.9] - I[0.9]b or SyncReset Syncresetb or ADCDelAdjln - ADCDelAdjlnb	Minimum differential swing Maximum differential swing	0.1 2	V
Data output current	A[0.9] to H[0.9] or RefA to RefH or DR or DRb	Maximum current	36	mV
TTL input voltages	Clkln Type RatioSel NbBit AsyncReset BIST		GND to VCC	V
Maximum input voltage on diode for temperature measurement	_DIODE		700	mV
Maximum junction temperature	_DIODE		8	mA
Maximum junction temperature	T_J		135	°C
Storage temperature	T_stg		TBD	°C

Description

The TSEV81102G0TPZR3 DMUX Evaluation Board (EB) is designed to simplify thecharacterization and the evaluation of the TS81102G0 device (2 Gsps DMUX). TheDMUX EB enables the test of all the functions of the DMUX: Synchronous and Asyn-chronous reset functions, selection of the DMUX ratio (1:4 or 1:8), selection of thenumber of bits (8 or 10), output data common mode and swing adjustment, die junc-tion temperature measurements over military temperature range, etc.

The TSEV81102G0TPZR3 has been designed to enable an easy connection with Atmel ADCEvaluation Boards (i.e.: TSEV8388BG, TSEV83102G0 or TSEV83084G0) for anextended functionality evaluation (ADC+DMUX multi-channels applications).

The TSEV81102G0TPZR3 comes fully assembled and tested, with a TS81102G0 device imple-mented on-board and a heatsink assembled on the device.

TSEV81102G0TPZR3

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