UT61128C64

DescriptionThe UT61128C64 is a 8,388,608-bit synchronous pipelined burst CMOS SRAM organized as 131,072 words by 64 bits.It is fabricated using high performance,high reliablility CMOS technology. Features of the UT61128C64 are:(1)single 3.3V-5% and +10% power supply ; (2)support 2.5V I/0; (3)fast ...

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SeekIC No. : 004539080 Detail

UT61128C64: DescriptionThe UT61128C64 is a 8,388,608-bit synchronous pipelined burst CMOS SRAM organized as 131,072 words by 64 bits.It is fabricated using high performance,high reliablility CMOS technology. Fe...

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Part Number:
UT61128C64
Supply Ability:
5000

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  • 1~5000
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Upload time: 2024/4/28

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Description



Description

The UT61128C64 is a 8,388,608-bit synchronous pipelined burst CMOS SRAM organized as 131,072 words by 64 bits.It is fabricated using high performance,high reliablility CMOS technology. Features of the UT61128C64 are:(1)single 3.3V-5% and +10% power supply ; (2)support 2.5V I/0; (3)fast clock access time:5ns/100MHz,6ns/75MHz,7ns/66MHz; (4)2 clocks chip enable/1 clock chip disable operation; (5)5V-tolerant inputs,TTL/LVTTL compatible outputs ; (6)synchronous pipeline operation; (7)internally self-timed WRITE cycle; (8)byte write and global write control; (9)write pass-through capability; (10)burst control pin (interleaved or linear burst); (11)zz snooze mode control ; (12)128-pin pqfp and tqfp package.

The absolute maximum ratings of the UT61128C64 can be summarized as:(1)voltage on Vcc supply relative to Vss:-0.5~4.6V; (2)Vin:-0.5~6V; (3)storage temperature (plastic):-55~150; (4)junction temperature:150; (5)power dissipation:1.6W; (6)short circuit output current:100mA.

The electrical characteristics(Ta=25) of the UT61128C64 can be summarized as:(1)input high voltage:2.2~5.5V; (2)input low voltage:-0.3~0.8V; (3)input leakage current:-1~1A; (4)output leakage current:-1~1A; (5)output high voltage:2.4V; (6)output low voltage:0.4V.If you want to know more information such as the electrical characteristics ,please download the datasheet in www.seekdatasheet.com .




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