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WE32K32-XG2UX

Features: ·Access Times of 80*, 90, 120, 150ns· MIL-STD-883 Compliant Devices Available· Packaging: • 68 lead, Hermetic CQFP (G2U), 22.4mm (0.880 ) square, 3.56mm (0.140 ) height (Package 510). Designed to fit JEDEC 68 lead 0.990 CQFJ footprint (Fig. 2)· 66-pin, PGA Type, 1.075 square, Her...

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SeekIC No. : 004545530 Detail

WE32K32-XG2UX: Features: ·Access Times of 80*, 90, 120, 150ns· MIL-STD-883 Compliant Devices Available· Packaging: • 68 lead, Hermetic CQFP (G2U), 22.4mm (0.880 ) square, 3.56mm (0.140 ) height (Package 510)...

WE32K32-XG2UX Data Sheet

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Part Number:
WE32K32-XG2UX
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/4/26

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Product Details

Description



Features:

· Access Times of 80*, 90, 120, 150ns
· MIL-STD-883 Compliant Devices Available
· Packaging:
    • 68 lead, Hermetic CQFP (G2U), 22.4mm (0.880") square, 3.56mm (0.140") height (Package 510). Designed to fit JEDEC 68 lead 0.990" CQFJ footprint (Fig. 2)
· 66-pin, PGA Type, 1.075" square, Hermetic Ceramic HIP (Package 400)
· Data Retention at 25°C, 10 Years
· Write Endurance, 10,000 Cycles
· Organized as 32Kx32; User Configurable 64Kx16 or 128Kx8
· Commercial, Industrial and Military Temperature Ranges
· Automatic Page Write Operation
· Page Write Cycle Time: 10ms Max
· Data Polling for End of Write Detection
· Hardware and Software Data Protection
· TTL Compatible Inputs and Outputs
· 5 Volt Power Supply
· Low Power CMOS, 10mA Standby Typical
· Built-in Decoupling Caps and Multiple Ground Pins for Low Noise Operation
* 80ns speed is not fully characterized and is subject to change or cancellation without notice.


Pinout

Connection Diagram


Specifications

Parameter
Symbol
Unit
Operating Temperature
TA
-55 to +125
V
Storage Temperature
TSTG
-65 to +150
V
Signal Voltage Relative to GND
VG
-0.6 to +6.25
°C
Voltage on OE and A9
-0.6 to +13.5
°C

NOTE:
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.




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