WE512K16-XG4X

Features: · Access Time of 140, 150, 200ns· Packaging: • 68 lead, 40mm Hermetic CQFP (Package 501)· Organized as 4 banks of 128Kx16· Write Endurance 10,000 Cycles· Data Retention Ten Years Minimum· Military Temperature Range· Low Power CMOS· Automatic Page Write Operation· Page Write Cycle T...

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WE512K16-XG4X Picture
SeekIC No. : 004545532 Detail

WE512K16-XG4X: Features: · Access Time of 140, 150, 200ns· Packaging: • 68 lead, 40mm Hermetic CQFP (Package 501)· Organized as 4 banks of 128Kx16· Write Endurance 10,000 Cycles· Data Retention Ten Years Min...

floor Price/Ceiling Price

Part Number:
WE512K16-XG4X
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Month Sales

268 Transactions

Rating

evaluate  (4.8 stars)

Upload time: 2024/4/27

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Product Details

Description



Features:

· Access Time of 140, 150, 200ns
· Packaging:
    • 68 lead, 40mm Hermetic CQFP (Package 501)
· Organized as 4 banks of 128Kx16
· Write Endurance 10,000 Cycles
· Data Retention Ten Years Minimum
· Military Temperature Range
· Low Power CMOS
· Automatic Page Write Operation
· Page Write Cycle Time: 10ms Max
· Data Polling for End of Write Detection
· Hardware and Software Data Protection
· TTL Compatible Inputs and Outputs
· 5 Volt Power Supply
· 8 Built-in Decoupling Caps and Multiple Ground Pins for Low Noise Operation
· Weight - 20 grams typical



Pinout

  Connection Diagram


Specifications

Parameter
Symbol
Unit
Operating Temperature
TA
-55 to +125
V
Storage Temperature
TSTG
-65 to +150
V
Signal Voltage Relative to GND
VG
-0.6 to +6.25
°C
Voltage on OE and A9
-0.6 to +13.5
°C
NOTE:
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.



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