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WE512K8

Features: ` Read Access Times of 150, 200, 250, 300ns` JEDEC Standard 32 Pin, Hermetic Ceramic DIP (Package 300)` Commercial, Industrial and Military Temperature Ranges` MIL-STD-883 Compliant Devices Available` Write Endurance 10,000 Cycles` Data Retention at 25, 10 Years` Low Power CMOS Operation...

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SeekIC No. : 004545533 Detail

WE512K8: Features: ` Read Access Times of 150, 200, 250, 300ns` JEDEC Standard 32 Pin, Hermetic Ceramic DIP (Package 300)` Commercial, Industrial and Military Temperature Ranges` MIL-STD-883 Compliant Device...

WE512K8 Data Sheet

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Part Number:
WE512K8
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/4/26

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Product Details

Description



Features:

` Read Access Times of 150, 200, 250, 300ns
` JEDEC Standard 32 Pin, Hermetic Ceramic DIP (Package 300)
` Commercial, Industrial and Military Temperature Ranges
` MIL-STD-883 Compliant Devices Available
` Write Endurance 10,000 Cycles
` Data Retention at 25, 10 Years
` Low Power CMOS Operation: 3mA Standby Typical/100mA Operating Maximum
` Automatic Page Write Operation Internal Address and Data Latches for 512 Bytes,
    1 to 128 Bytes/Row, Four Pages
` Page Write Cycle Time 10mS Max.
` Data Polling for End of Write Detection
` Hardware and Software Data Protection
` TTL Compatible Inputs and Outputs


Pinout

Connection Diagram


Specifications

Parameter Symbol   Unit
Operating Temperature TA -55 to +125
Storage Temperature TSTG -65 to +150
Signal Voltage Any Pin VG -0.6 to + 6.25 V
Voltage on OE# and A9 JC -0.6 to +13.5 V
Thermal Resistance junction to case   28 /W
Lead Temperature (soldering -10 secs)   +300

NOTE:
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specifi cation is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.




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