XQ4000E

Features: • Certified to MIL-PRF-38535, appendix A QML (Qualified Manufacturers Listing)• Also available under the following Standard Microcircuit Drawings (SMD)- XC4005E 5962-97522- XC4010E 5962-97523- XC4013E 5962-97524- XC4025E 5962-97525- XC4028EX 5962-98509• For more informa...

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SeekIC No. : 004549111 Detail

XQ4000E: Features: • Certified to MIL-PRF-38535, appendix A QML (Qualified Manufacturers Listing)• Also available under the following Standard Microcircuit Drawings (SMD)- XC4005E 5962-97522- XC4...

floor Price/Ceiling Price

Part Number:
XQ4000E
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/4/25

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Product Details

Description



Features:

• Certified to MIL-PRF-38535, appendix A QML
  (Qualified Manufacturers Listing)
• Also available under the following Standard Microcircuit Drawings (SMD)
- XC4005E 5962-97522
- XC4010E 5962-97523
- XC4013E 5962-97524
- XC4025E 5962-97525
- XC4028EX 5962-98509
• For more information contact the Defense Supply
  Center Columbus (DSCC)
  http://www.dscc.dla.mis/v/va/smd/smdsrch.html
• System featured Field-Programmable Gate Arrays
- Select-RAMTM memory: on-chip ultra-fast RAM with
· Synchronous write option
· Dual-port RAM option
- Abundant flip-flops
- Flexible function generators
- Dedicated high-speed carry logic
- Wide edge decoders on each edge
- Hierarchy of interconnect lines
- Internal 3-state bus capability
- Eight global low-skew clock or signal distribution networks
• System Performance beyond 60 MHz
• Flexible Array Architecture
• Low Power Segmented Routing Architecture
• Systems-Oriented Features
- IEEE 1149.1-compatible boundary scan logic support
- Individually programmable output slew rate
- Programmable input pull-up or pull-down resistors
- 12 mA sink current per XQ4000E/EX output
• Configured by Loading Binary File
- Unlimited reprogrammability
• Readback Capability
- Program verification
- Internal node observability
• Backward Compatible with XC4000 Devices
• Development System runs on most common computer platforms
- Interfaces to popular design environments
- Fully automatic mapping, placement and routing
- Interactive design editor for design optimization
• Available Speed Grades:
- XQ4000E -3 for plastic packages only
- -4 for ceramic packages only
- XQ4028EX -4 for all packages



Specifications

Symbol Description   Units
VCC Supply voltage relative to GND 0.5 to +7.0 V
VIN Input voltage relative to GND(2) 0.5 to VCC + 0.5 V
VTS Voltage applied to High-Z output(2) 0.5 to VCC + 0.5 V
TSTG Storage temperature (ambient) 65 to +150 °C
TSOL Maximum soldering temperature (10s @ 1/16 in. = 1.5 mm) +260 °C
TJ Junction temperature Ceramic package +150 °C
Plastic package +125 °C
Notes:
1. Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, and functional operation of the device at these or any other conditions beyond those listed under Operating Conditions
is not implied. Exposure to Absolute Maximum Ratings conditions for extended periods of time may affect device reliability.
2. Maximum DC excursion above VCC or below Ground must be limited to either 0.5V or 10 mA, whichever is easier to achieve. During
transitions, the device pins may undershoot to 2.0V or overshoot to VCC + 2.0V, provided this over or undershoot lasts less than
10 ns and with the forcing current being limited to 200 mA.



Description

For more information refer to Xilinx XC4000E and XC4000X series Field Programmable Gate Arrays product specification. This data sheet contains pinout tables for XQ4010E only. Refer to Xilinx web site for pinout tables for other devices. (Pinouts for XQ4000E/EX are identical to XC4000E/EX.)


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