HA16830F-the Intergrated Circuit of Sound Signal and Busy Noise Testing

Published:2011/5/12 0:57:00 Author:Borg | Keyword: Intergrated Circuit, Sound Signal, Busy Noise | From:SeekIC

HA16830F is a specialized intergrated circuit produced by Hitachi, Japan, which can test and rectify busy noise of 400HZ and test conversationa sounds. 1.function features HA16830 fulfills functions of testing the answering phone terminals, whose working voltage ranges 4.5-6.6V, typical working voltage is 5V. 2.pin functions and data HA16830 is packaged in FP-2ON. 3.typical application circuit HA16830F is a partial circuit of intelligent emegency calling systems, which is used by homes, the core of it is to test all the indoor sensors in turn and control them by using PICl6C55.



Reprinted Url Of This Article:
http://www.seekic.com/circuit_diagram/Signal_Processing/HA16830F_the_Intergrated_Circuit_of_Sound_Signal_and_Busy_Noise_Testing.html

Print this Page | Comments | Reading(3)