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Part Number: 2SJ349

 

 

 

 

 

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2SJ349 Maximum Ratings

Characteristics
Symbol
Ratings
Unit
Drain-source voltage
VDSS
−60
V
Drain-gate voltage (RGS=20 k)
VDGR
−60
V
Gate-source voltage
VGSS
±20
V
Drain current DC(Note 1)
ID
−20
A
Pulse (Note 1)
IDP
−80
A
Drain power dissipation (Tc = 25)
PD
45
W
Single-pulse avalanche energy (Note2)
EAS
800
mJ
Avalanche current
IAR
−20
A
Repetitive avalanche energy (Note 3)
EAR
4.5
mJ
Channel temperature
Tch
150
Storage temperature range
Tstg
−55~150

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

2SJ349 Typical Application

 4-V gate drive
Low drain−source ON resistance : RDS (ON) = 33 m (typ.)
High forward transfer admittance : |Yfs| = 20 S (typ.)
Low leakage current : IDSS = −100 A (max) (VDS = −60 V)
Enhancement mode : Vth = −0.8~−2.0 V (VDS = −10 V, ID = −1 mA)

2SJ349 datasheet

2SJ349
PDF/DataSheet Download

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