Features: • Silicon chip on Direct-Copper-Bond substrate - High power dissipation -Isolated mounting surface - 2500V electrical isolation• Low drain to tab capacitance(<50pF)• Low RDS (on) HDMOSTM process• Rugged polysilicon gate cell structure• Unclamped Inductive...
IXFR 26N50: Features: • Silicon chip on Direct-Copper-Bond substrate - High power dissipation -Isolated mounting surface - 2500V electrical isolation• Low drain to tab capacitance(<50pF)• L...
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Specifications VDSS TJ = 25°Cto 150°C1000 V VDGR TJ = 25°C to 150°C; RGS = 1 M1000V VGS...
Specifications VDSS TJ = 25°Cto 150°C1000 V VDGR TJ = 25°C to 150°C; RGS = 1 M1000V VGS...
Features: • Silicon chip on Direct-Copper-Bond substrate - High power dissipation - Isolated...
| Symbol | Test Conditions | ||
| VDSS | TJ = 25 to 150 | 500 | V |
| VDGR | TJ = 25 to 150; RGS = 1 M | 500 | V |
| VGS | Continuous | ±20 | V |
| VGSM | Transient | ±30 | V |
| ID25 | TC = 25 | 26 | A |
| IDM | TC = 25, Pulse width limited by TJM | 104 | A |
| IAR | TC = 25 | 26 | A |
| EAR | TC = 25 | 30 | mJ |
| dv/dt | IS IDM, di/dt 100 A/s, VDD VDSS TJ 150, RG = 2 |
5 | V/ns |
| PD | TC = 25 | 250 | W |
| TJ | -55 ... +150 | ||
| TJM | 150 | ||
| Tstg | -55 ... +150 | ||
| TL | 1.6 mm (0.063 in.) from case for 10 s | 300 | |
| VISOL | 50/60 Hz, RMS t = 1 min | 2500 | V~ |
| Weight | 6 | g |