MC68HC916Y3

NOTES:
1. Permanent damage can occur if maximum ratings are exceeded. Exposure to voltages or currents in excess of recommended values affects device reliability. Device modules may not operate normally while being exposed to electrical extremes.
2. Although sections of the device contain circuitry to protect against damage from high static voltages or electrical fields, take normal precautions to avoid exposure to voltages higher than maximum-rated voltages.
3. This parameter is periodically sampled rather than 100% tested.
4. All pins except TSC.
5. Input must be current limited to the value specified. To determine the value of the required current-limiting resistor, calculate resistance values for positive and negative clamp voltages, then use the larger of the two values.
6. Power supply must maintain regulation within operating VDD range during instantaneous and operating maximum current conditions.
7. All functional non-supply pins are internally clamped to VSS for transitions below V_SS. All functional pins except EXTAL, TSC, and XFC are internally clamped to V_DD for transitions below V_DD.
8. Total input current for all digital input-only and all digital input/output pins must not exceed 10 mA. Exceeding this limit can cause disruption of normal operation.
9. V_FPE must not be raised to programming level while V_DD is below specified minimum value. V_FPE must not
be reduced below minimum specified value while V_DD is applied.
10. Flash EEPROM modules can be damaged by power-on and power-off V_FPE transients. Maximum power-on overshoot tolerance is 13.5 V for periods of less than 30 ns.