NE6500496

Transistors RF GaAs L&S Band GaAs MESFET

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SeekIC No. : 00219261 Detail

NE6500496: Transistors RF GaAs L&S Band GaAs MESFET

floor Price/Ceiling Price

Part Number:
NE6500496
Mfg:
CEL
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/4/28

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Product Details

Quick Details

Technology Type : MESFET Frequency : 2.3 GHz
Gain : 11.5 dB Forward Transconductance gFS (Max / Min) : 1.3 S
Drain Source Voltage VDS : 15 V Gate-Source Breakdown Voltage : - 12 V
Continuous Drain Current : 3.5 A Maximum Operating Temperature : + 175 C
Power Dissipation : 25 W Mounting Style : SMD/SMT
Package / Case : Outline96    

Description

Noise Figure :
Mounting Style : SMD/SMT
Drain Source Voltage VDS : 15 V
Gain : 11.5 dB
Technology Type : MESFET
Frequency : 2.3 GHz
Maximum Operating Temperature : + 175 C
Gate-Source Breakdown Voltage : - 12 V
Forward Transconductance gFS (Max / Min) : 1.3 S
Continuous Drain Current : 3.5 A
Power Dissipation : 25 W
Package / Case : Outline96


Features:

• Class A operation
• High output power: 36 dBm (typ)
• High gain: 11.5 dB (typ)
• High power added efficiency: 45 % (typ)
• Hermetically sealed ceramic package



Specifications

Drain to Source Voltage .. VDSX                 15               V
Gate to Drain Voltage ... VGDX               18               V
Gate to Source Voltage .. VGSX                12               V
Drain Current .......... ID                4.5                A
Gate Current..........   IG                25               mA
Total Power Dissipation .. PT(*)                25                W
Channel Temperature .... Tch               175               °C
Storage Temperature ....Tstg        65 to +175       °C
Temperature Cycling ..... T        40 to +120       °C



Description

The NE6500496 is power GaAs FET which provides high gain, high efficiency and high output power in L, S band.

To reduce thermal resistance, the NE6500496 has a PHS (Plated Heat Sink) structure.


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