RH1280

The RH1020 and RH1280 devices are targeted for use in military and space applications subject to radiation effects.

1. Accumulated Total Dose Effects
With the significant increase in Earth-orbiting satellite launches and the ever-decreasing time-to-launch design cycles, the RH1020 and RH1280 devices offer the best combination of total dose radiation hardness and quick design implementation necessary for this increasingly competitive industry. In addition, the high total dose capability allows the use of these devices for deep space probes, which encounter other planetary bodies where the total dose radiation effects are more pronounced.

2. Single Event Effects (SEE)
Many space applications are more concerned with the number of single event upsets and potential for latch-up in space. The RH1020 and RH1280 devices are latch-up immune, guaranteeing that no latch-up failures will occur. Single event upsets can occur in these devices as with all semiconductor products, but the rate of upset is low, as shown in the RadHard Radiation specifications table on page 7.

3. High Dose Rate Survivability
An additional radiation concern is high dose rate survivability. Solar flares and sudden nuclear events can cause immediate high levels of radiation. The RadHard devices are appropriate for use in these types of applications, including missile systems,ground-based communication systems, and orbiting satellites.