SCAN182374A

Storage Temperature ......................−65°C to +150°C
Ambient Temperature under Bias.... −55°C to +125°C
Junction Temperature under Bias.... −55°C to +150°C
V_CC Pin Potential to Ground Pin .............−0.5V to +7.0V
Input Voltage (Note 3) ...........................−0.5V to +7.0V
Input Current (Note 3) ....................−30 mA to +5.0 mA
Voltage Applied to Any Output
   in the Disabled or
   Power-Off State   . ..............................−0.5V to +5.5V
   in the HIGH State ...................................−0.5V to V_CC
Current Applied to Output
   in LOW State (Max) ..............Twice the Rated I_OL (mA)
DC Latchup Source Current ..............................−500 mA
Over Voltage Latchup (I/O) .....................................10V
ESD (HBM) Min..................................................... 2000V

Note 2: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life  impaired. Functional operation under these conditions is not implied.
Note 3: Either voltage limit or current limit is sufficient to protect inputs.

The SCAN182374A is a high performance BiCMOS D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals. This SCAN182374A is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).