STP80NF75L

MOSFET

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STP80NF75L Picture
SeekIC No. : 00166565 Detail

STP80NF75L: MOSFET

floor Price/Ceiling Price

Part Number:
STP80NF75L
Mfg:
STMicroelectronics
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/12/24

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Product Details

Quick Details

Transistor Polarity : N-Channel Drain-Source Breakdown Voltage : 75 V
Gate-Source Breakdown Voltage : +/- 16 V Continuous Drain Current : 80 A
Resistance Drain-Source RDS (on) : 0.01 Ohms Configuration : Single
Maximum Operating Temperature : + 175 C Mounting Style : Through Hole
Package / Case : TO-220 Packaging : Tube    

Description

Transistor Polarity : N-Channel
Configuration : Single
Maximum Operating Temperature : + 175 C
Mounting Style : Through Hole
Packaging : Tube
Drain-Source Breakdown Voltage : 75 V
Continuous Drain Current : 80 A
Package / Case : TO-220
Gate-Source Breakdown Voltage : +/- 16 V
Resistance Drain-Source RDS (on) : 0.01 Ohms


Features:

·TYPICAL RDS(on) = 0.008 W
·EXCEPTIONAL dv/dt CAPABILITY
·100% AVALANCHE TESTED
·LOW THRESHOLD DRIVE



Application

·HIGH CURRENT, HIGH SWITCHING SPEED
·MOTOR CONTROL, AUDIO AMPLIFIERS
·DC-DC & DC-AC CONVERTERS
·SOLENOID AND RELAY DRIVERS



Specifications

Symbol Parameter Value Unit
VDS
Drain-source Voltage (VGS = 0) 75 V
VDGR Drain-gate Voltage (RGS = 20 k) 75 V
VGS Gate- source Voltage ± 16 V
ID(`) Drain Current (continuos) at TC = 25 80 A
ID Drain Current (continuos) at TC = 100 80 A
IDM(``) Drain Current (pulsed) 320 A
Ptot Total Dissipation at TC = 25 300 W
  Derating Factor 2 W/
dv/dt (1) Peak Diode Recovery voltage slope 12 V/ns
EAS (2) Single Pulse Avalanche Energy 930 mJ
Tstg Storage Temperature -55 to 175
Tj Max. Operating Junction Temperature



Description

This Power MOSFET STP80NF75L is the latest development of STMicroelectronis unique "Single Feature Size™" strip-based process. The resulting transistor shows extremely high packing density for low onresistance, rugged avalanche characteristics and less critical alignment steps therefore a remarkable manufacturing reproducibility.



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