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TPD2004F

Features: • Using independent four-channel inputs, this IC controls two high-side and two low-side switches, making it possible to drive two squibs directly.• Incorporates various diagnostic functions (analog multiplexer outputs): -Squib short-to-battery diagnosis-Squib short-to-ground...

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SeekIC No. : 004526281 Detail

TPD2004F: Features: • Using independent four-channel inputs, this IC controls two high-side and two low-side switches, making it possible to drive two squibs directly.• Incorporates various diagno...

TPD2004F Data Sheet

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Part Number:
TPD2004F
Supply Ability:
5000

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  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• Using independent four-channel inputs, this IC controls two high-side
   and two low-side switches, making it possible to drive two squibs directly.
• Incorporates various diagnostic functions (analog multiplexer outputs):
    - Squib short-to-battery diagnosis
    -Squib short-to-ground diagnosis
    - Squib open-circuit diagnosis
    - Safing sensor-ON fault diagnosis
    -High-redundancy, upstream arrangement for safing sensor
    - Squib short diagnosis
    - Squib drive MOSFET diagnosis
• Chip select function allows for multi-channel structure to be materialized using minimum control lines.
• Comes in a 24-pin SSOP surface mount package.
• Supports embossed taping.


Pinout

Connection Diagram


Specifications

Characteristics Symbol Rating Unit
Power Supply Voltage VBB 30 V
VCC 10
Input Voltage SS 30 V
VIN -0.5~7
Backup Capacitor Capacitance CM 1500 (1ch) F
Backup Capacitor Charging Voltage CV 25 V
Squib ON-Time tON 15 ms
Squib Driver Current (channel) ISQ 10 A
Power Dissipation PD 0.8 W
Operating Temperature Topr -40~85
Junction Temperature Tj 150
Storage Temperature Tstg -55~150

Note1: The squib driver uses a 60V tolerant output device. However, this does not guarantee that the squib tolerates 60V because this varies with the withstand voltages of peripheral circuits.
Note2: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).




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