AM27C64-255DC

The Am27C64 is a 64-Kbit cmos eprom,ultraviolet erasable pro-grammable read-only memory.It is organized as 8K words by 8 bits per word,operates from a single +5V supply,has a static standby mode, and features fast single address location programming.Products are available in windowed ceramic DIP packages,as well as plastic one time programmable (OTP)PDIP and PLCC packages.

Features of the Am27C64 are:(1)Fast access time:Speed options as fast as 45 ns;(2)Low power consumption:20 µA typical CMOS standby current;(3)JEDEC-approved pinout;(4)Single +5 V power supply;(5)±10% power supply tolerance standard;(6)100% Flashrite™ programming:Typical programming time of 1 second;(7)Latch-up protected to 100 mA from 1 V to V_CC+1 V;(8)High noise immunity;(9)Versatile features for simple interfacing:Both CMOS and TTL input/output compatibility,Two line control functions;(10)Standard 28-pin DIP, PDIP, and 32-pin PLCC
packages.

The absolute maximum ratings of the Am27C64 can be summarized as:(1)Storage Temperature OTP Products:-65 to +125;(2)All Other Products:-65 to +150;(3)Ambient Temperature with Power Applied:-55 to +125;(4)Voltage with Respect to VSS All pins except A9,V_PP, V_CC:0.6V to V_CC+0.6 V;(5)A9 and V_PP(Note 2):0.6V to 13.5V;(6)V_CC (Note 1):0.6V to 7.0V.1.   Minimum DC voltage on input or I/O pins 0.5 V. During voltage transitions, the input may overshoot V_SS to 2.0 V for periods of up to 20 ns. Maximum DC voltage on input and I/O pins is V_CC + 5 V. During voltage transitions, input and I/O pins may overshoot to V_CC + 2.0 V for periods up to 20 ns.2.Minimum DC input voltage on A9 is 0.5 V.During voltage transitions, A9 and VPP may overshoot V_SS to 2.0 V for periods of up to 20 ns. A9 and V_PP must not exceed+13.5V at any time.Stresses above those listed under "Absolute Maximum Rat- ings" may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the opera- tional sections of this specification is not implied. Exposure of the device to absolute maximum ratings for extended periods may affect device reliability.