Features: • Enhancement mode type• High speed : tf = 0.11 s (typ.) (IC = 60 A)• Low saturation voltage : VCE (sat) = 2.4 V (typ.) (IC = 60 A)• FRD included between emitter and collector• TO-3P(LH) (Toshiba package name)Specifications Characteristics Symbol Rati...
GT60N322: Features: • Enhancement mode type• High speed : tf = 0.11 s (typ.) (IC = 60 A)• Low saturation voltage : VCE (sat) = 2.4 V (typ.) (IC = 60 A)• FRD included between emitter an...
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Characteristics | Symbol | Rating | Unit | |
Collector-emitter voltage | VCES | 1000 | V | |
Gate-emitter voltage | VGES | ±25 | V | |
Continuous collector current |
@Tc = 100°C | IC | 29 | A |
@Tc = 25°C | 57 | |||
Pulsed collector current (Note 1) | ICP | 120 | A | |
Collector power dissipation |
@Tc = 100°C | PC | 80 | W |
@Tc = 25°C | 200 | |||
Diode forward current | DC | IF | 15 | A |
Pulsed | IFP | 120 | A | |
Junction temperature | Tj | 150 | ||
Storage temperature | Tstg | -55~150 |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the ignificant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).